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Introduction to optical testing

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Introduction to optical testing/ Joseph M. Geary.
Author:	Geary, Joseph M.
Published:	Bellingham, Wash. (1000 20th St. Bellingham WA 98225-6705 USA) :SPIE, : 1993.,
Description:	1 online resource (xii, 149 p. : ill.) :digital file. :
Notes:	"SPIE digital library."
Subject:	Optical instruments - Testing. -
Online resource:	http://dx.doi.org/10.1117/3.147225
ISBN:	9780819480996 (electronic)

Introduction to optical testing
Geary, Joseph M.

Introduction to optical testing[electronic resource] /Joseph M. Geary. - Bellingham, Wash. (1000 20th St. Bellingham WA 98225-6705 USA) :SPIE,1993. - 1 online resource (xii, 149 p. : ill.) :digital file. - Tutorial texts in optical engineering ;v. TT15. - SPIE tutorial texts ;TT06..

"SPIE digital library."

Includes bibliographical references and index.

Preface -- Chapter 1. Optical bench measurements on imaging systems. 1.1. Introduction; 1.2. Effective focal length; 1.3. f-number; 1.4. Axial color; 1.5. Field curvature and distortion; 1.6. Transmission; 1.7. Relative illumination falloff; 1.8. Veiling glare; 1.9. Thermal behavior; 1.10. References -- Appendix 1.1. Basic geometrical optics -- Appendix 1.2. Relative illumination falloff -- Chapter 2. Aberration and resolution measurements. 2.1. Introduction; 2.2. Spherical aberration; 2.3. Astigmatism; 2.4. Coma; 2.5. Image resolution; 2.6. Modulation transfer function tests; 2.7. References -- Chapter 3. Interferometric testing of optical systems. 3.1. Introduction; 3.2. Mathematical description of aberrations; 3.3. Fizeau interferometer; 3.4. Analyzing an interferogram; 3.5. Testing a lens; 3.6. Retrace error; 3.7. Collecting and handling data; 3.8. Environmental constraints; 3.9. Mounting; 3.10. References -- Appendix 3.1. Testing configurations using a Fizeau interferometer.

Restricted to subscribers or individual electronic text purchasers.

This volume in the SPIE Tutorial Text series presents a practical approach to optical testing, with emphasis on techniques, procedures, and instrumentation rather than mathematical analysis. The author provides the reader with a basic understanding of the measurements made and the tools used to make those measurements. Detailed information is given on how to measure and characterize imaging systems, perform optical bench measurements to determine first- and third-order properties of optical systems, set up and operate a Fizeau interferometer and evaluate fringe data, conduct beam diagnostics (such as wavefront sensing), and perform radiometric calibrations.

Mode of access: World Wide Web.

ISBN: 9780819480996 (electronic)

Standard No.: 10.1117/3.147225doiSubjects--Topical Terms:

797526
Optical instruments
--Testing.

LC Class. No.: TS514 / .G43 1993

Dewey Class. No.: 681/.4/0287

Introduction to optical testing
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245 1 0 $a Introduction to optical testing $h [electronic resource] / $c Joseph M. Geary.
260 $a Bellingham, Wash. (1000 20th St. Bellingham WA 98225-6705 USA) : $b SPIE, $c 1993.
300 $a 1 online resource (xii, 149 p. : ill.) : $b digital file.
490 1 $a Tutorial texts in optical engineering ; $v v. TT15
500 $a "SPIE digital library."
504 $a Includes bibliographical references and index.
505 0 $a Preface -- Chapter 1. Optical bench measurements on imaging systems. 1.1. Introduction; 1.2. Effective focal length; 1.3. f-number; 1.4. Axial color; 1.5. Field curvature and distortion; 1.6. Transmission; 1.7. Relative illumination falloff; 1.8. Veiling glare; 1.9. Thermal behavior; 1.10. References -- Appendix 1.1. Basic geometrical optics -- Appendix 1.2. Relative illumination falloff -- Chapter 2. Aberration and resolution measurements. 2.1. Introduction; 2.2. Spherical aberration; 2.3. Astigmatism; 2.4. Coma; 2.5. Image resolution; 2.6. Modulation transfer function tests; 2.7. References -- Chapter 3. Interferometric testing of optical systems. 3.1. Introduction; 3.2. Mathematical description of aberrations; 3.3. Fizeau interferometer; 3.4. Analyzing an interferogram; 3.5. Testing a lens; 3.6. Retrace error; 3.7. Collecting and handling data; 3.8. Environmental constraints; 3.9. Mounting; 3.10. References -- Appendix 3.1. Testing configurations using a Fizeau interferometer.
505 0 $a Chapter 4. Wavefront sensors. 4.1. Introduction; 4.2. Principles of operation; 4.3. Direct measure of W(x,y): point diffraction interferometer; 4.4. Measures of differential wavefront (dW); 4.5. Measures of transverse ray error (T); 4.6. References -- Chapter 5. General light beam measurements. 5.1. Introduction; 5.2. Power-related measurements; 5.3. Color; 5.4. Coherence measurements; 5.5. Polarization; 5.6. Directionality (pointing): beam tilt sensing; 5.7. References -- Chapter 6. Component measurements. 6.1. Introduction; 6.2. Radius of curvature; 6.3. Refractive index; 6.4. Spectral transmission; 6.5. Collimation; 6.6. Surface roughness; 6.7. Light scattering; 6.8. Ellipsometry; 6.9. Instruments for (black and white) photographic film; 6.10. Extended source brightness (radiance); 6.11. References -- Index.
506 $a Restricted to subscribers or individual electronic text purchasers.
520 $a This volume in the SPIE Tutorial Text series presents a practical approach to optical testing, with emphasis on techniques, procedures, and instrumentation rather than mathematical analysis. The author provides the reader with a basic understanding of the measurements made and the tools used to make those measurements. Detailed information is given on how to measure and characterize imaging systems, perform optical bench measurements to determine first- and third-order properties of optical systems, set up and operate a Fizeau interferometer and evaluate fringe data, conduct beam diagnostics (such as wavefront sensing), and perform radiometric calibrations.
530 $a Also available in print version.
538 $a Mode of access: World Wide Web.
538 $a System requirements: Adobe Acrobat Reader.
650 0 $a Optical instruments $x Testing. $3 797526
650 0 $a Electronic instruments. $3 572904
710 2 $a Society of Photo-optical Instrumentation Engineers. $3 700253
830 0 $a SPIE tutorial texts ; $v TT06. $3 877241
856 4 0 $u http://dx.doi.org/10.1117/3.147225