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Testing for EMC compliance = approac...
~
Nakauchi, Edward M.
Testing for EMC compliance = approaches and techniques /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Testing for EMC compliance/ Mark I. Montrose, Edward M. Nakauchi.
其他題名:
approaches and techniques /
作者:
Montrose, Mark I.
其他作者:
Nakauchi, Edward M.
出版者:
Hoboken, NJ :John Wiley, : 2004.,
面頁冊數:
1 online resource (xviii, 460 p.) :ill. :
標題:
Electromagnetic compatibility. -
電子資源:
http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237008
ISBN:
0471644684 (electronic bk.)
Testing for EMC compliance = approaches and techniques /
Montrose, Mark I.
Testing for EMC compliance
approaches and techniques /[electronic resource] :Mark I. Montrose, Edward M. Nakauchi. - Hoboken, NJ :John Wiley,2004. - 1 online resource (xviii, 460 p.) :ill.
Includes bibliographical references (p. 447-451) and index.
Cover -- CONTENTS -- Preface -- Acknowledgments -- 1 Introduction -- 1.1 The Need to Comply -- 1.2 Definitions -- 1.3 Nature of Interference -- 1.4 Overview on Product Testing -- 1.4.1 Test Environment -- 1.4.2 Self-Compatibility -- 1.4.3 Validation of Measured Data -- 1.4.4 Problems during Emissions Testing -- 1.5 Time-Domain versus Frequency-Domain Analysis -- 1.6 EMC Testing Methodologies -- 1.6.1 Development Testing and Diagnostics -- 1.6.2 Compliance and Precompliance Testing -- References -- 2 Electric, Magnetic, and Static Fields -- 2.1 Relationship between Electric and Magnetic Fields -- 2.2 Methods of Noise Coupling -- 2.2.1 Common-Impedance Coupling -- 2.2.2 Electromagnetic Field Coupling -- 2.2.3 Conductive Coupling -- 2.2.4 Radiated Coupling...Magnetic Field -- 2.2.5 Radiated Coupling...Electric Field -- 2.2.6 Radiated and Conducted Coupling Combined -- 2.3 Common-Mode Currents versus Differential-Mode Currents -- 2.3.1 Differential-Mode Currents -- 2.3.2 Common-Mode Currents -- 2.3.3 Example on Difference between Differential- and Common-Mode Currents -- 2.3.4 Radiation due to Differential-Mode Currents -- 2.3.5 Common-Mode Radiation -- 2.3.6 Conversion between Differential- and Common-Mode Energy -- 2.4 Static Fields -- 2.4.1 Electrostatic Discharge Waveforms -- 2.4.2 Triboelectric Series -- 2.4.3 Failure Modes From a Static Event -- References -- 3 Instrumentation -- 3.1 Time-Domain Analyzer (Oscilloscope) -- 3.1.1 Oscilloscope Probes -- 3.2 Frequency-Domain Analyzers -- 3.2.1 Spectrum Analyzers -- 3.2.2 Receivers -- 3.3 Precompliance versus Compliance Analyzers -- 3.4 Correlation Analyzer -- 3.4.1 Characteristics of Cancellation System -- 3.4.2 Coherence Factor -- References -- 4 Test Facilities -- 4.1 Open-Area Test Sites -- 4.1.1 Requirements for an OATS -- 4.1.2 Test Configuration"System, Power, and Cable Interconnects -- 4.1.3 Operating Conditions -- 4.1.4 Measurement Precautions -- 4.1.5 Alternate Test Sites -- 4.2 Chambers -- 4.2.1 Anechoic Chamber -- 4.2.2 Screen/Shield Rooms -- 4.2.3 Reverberation Chamber -- 4.3 Cells -- 4.3.1 TEM Cell -- 4.3.2 GTEM Cell -- References -- 5 Probes, Antennas, and Support Equipment -- 5.1 Need for Probes, Antennas, and Support Equipment -- 5.2 Voltage Probes -- 5.3 Current Probes -- 5.3.1 Specifying a Current Probe -- 5.3.2 Limitations When Using Current Probes -- 5.4 LISN/AMN (AC Mains) -- 5.5 CDNs (Data and Signal Lines) -- 5.6 Absorbing Clamp -- 5.6.1 Test Setup and Measurement Procedure -- 5.7 Bulk Current Injection"Probe and Insertion Clamp -- 5.7.1 Choosing a BCI Probe -- 5.8 Basic Probe Types"Near Field and Closed Field -- 5.9 Sniffer Probes -- 5.9.1 Near-Field Probes -- 5.9.2 Commercial Probes -- 5.10 Differential-Mode Probes -- 5.11 Home-Made Probes -- 5.12 Alternate Troubleshooting Devices -- 5.13 Far-Field Antennas -- 5.13.1 Common Antennas Used for EMC Testing -- References -- 6 Conducted Testing -- 6.1 Overview of Conducted Currents -- 6.1.1 Common- and Differential-Mode Currents on Wires
ISBN: 0471644684 (electronic bk.)
Standard No.: 10.1002/047164465Xdoi
OverDrive, Inc.http://www.overdrive.comSubjects--Topical Terms:
563969
Electromagnetic compatibility.
Subjects--Index Terms:
Electromagnetic compatibilityIndex Terms--Genre/Form:
554714
Electronic books.
LC Class. No.: TK7867.2 / M66 2004eb
Dewey Class. No.: 621.382/24
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Cover -- CONTENTS -- Preface -- Acknowledgments -- 1 Introduction -- 1.1 The Need to Comply -- 1.2 Definitions -- 1.3 Nature of Interference -- 1.4 Overview on Product Testing -- 1.4.1 Test Environment -- 1.4.2 Self-Compatibility -- 1.4.3 Validation of Measured Data -- 1.4.4 Problems during Emissions Testing -- 1.5 Time-Domain versus Frequency-Domain Analysis -- 1.6 EMC Testing Methodologies -- 1.6.1 Development Testing and Diagnostics -- 1.6.2 Compliance and Precompliance Testing -- References -- 2 Electric, Magnetic, and Static Fields -- 2.1 Relationship between Electric and Magnetic Fields -- 2.2 Methods of Noise Coupling -- 2.2.1 Common-Impedance Coupling -- 2.2.2 Electromagnetic Field Coupling -- 2.2.3 Conductive Coupling -- 2.2.4 Radiated Coupling...Magnetic Field -- 2.2.5 Radiated Coupling...Electric Field -- 2.2.6 Radiated and Conducted Coupling Combined -- 2.3 Common-Mode Currents versus Differential-Mode Currents -- 2.3.1 Differential-Mode Currents -- 2.3.2 Common-Mode Currents -- 2.3.3 Example on Difference between Differential- and Common-Mode Currents -- 2.3.4 Radiation due to Differential-Mode Currents -- 2.3.5 Common-Mode Radiation -- 2.3.6 Conversion between Differential- and Common-Mode Energy -- 2.4 Static Fields -- 2.4.1 Electrostatic Discharge Waveforms -- 2.4.2 Triboelectric Series -- 2.4.3 Failure Modes From a Static Event -- References -- 3 Instrumentation -- 3.1 Time-Domain Analyzer (Oscilloscope) -- 3.1.1 Oscilloscope Probes -- 3.2 Frequency-Domain Analyzers -- 3.2.1 Spectrum Analyzers -- 3.2.2 Receivers -- 3.3 Precompliance versus Compliance Analyzers -- 3.4 Correlation Analyzer -- 3.4.1 Characteristics of Cancellation System -- 3.4.2 Coherence Factor -- References -- 4 Test Facilities -- 4.1 Open-Area Test Sites -- 4.1.1 Requirements for an OATS -- 4.1.2 Test Configuration"System, Power, and Cable Interconnects -- 4.1.3 Operating Conditions -- 4.1.4 Measurement Precautions -- 4.1.5 Alternate Test Sites -- 4.2 Chambers -- 4.2.1 Anechoic Chamber -- 4.2.2 Screen/Shield Rooms -- 4.2.3 Reverberation Chamber -- 4.3 Cells -- 4.3.1 TEM Cell -- 4.3.2 GTEM Cell -- References -- 5 Probes, Antennas, and Support Equipment -- 5.1 Need for Probes, Antennas, and Support Equipment -- 5.2 Voltage Probes -- 5.3 Current Probes -- 5.3.1 Specifying a Current Probe -- 5.3.2 Limitations When Using Current Probes -- 5.4 LISN/AMN (AC Mains) -- 5.5 CDNs (Data and Signal Lines) -- 5.6 Absorbing Clamp -- 5.6.1 Test Setup and Measurement Procedure -- 5.7 Bulk Current Injection"Probe and Insertion Clamp -- 5.7.1 Choosing a BCI Probe -- 5.8 Basic Probe Types"Near Field and Closed Field -- 5.9 Sniffer Probes -- 5.9.1 Near-Field Probes -- 5.9.2 Commercial Probes -- 5.10 Differential-Mode Probes -- 5.11 Home-Made Probes -- 5.12 Alternate Troubleshooting Devices -- 5.13 Far-Field Antennas -- 5.13.1 Common Antennas Used for EMC Testing -- References -- 6 Conducted Testing -- 6.1 Overview of Conducted Currents -- 6.1.1 Common- and Differential-Mode Currents on Wires
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