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Radiation effects in semiconductors /

Iniewski, Krzysztof, (1960-)

Radiation effects in semiconductors /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Radiation effects in semiconductors // edited by Krzysztof Iniewski.
其他作者:	Iniewski, Krzysztof,
出版者:	Boca Raton :CRC Press, : c2011.,
面頁冊數:	xv, 415 p. :ill. ; : 25 cm.;
標題:	Photon emission. -
ISBN:	1439826943 (cloth) :

Radiation effects in semiconductors /
Radiation effects in semiconductors /edited by Krzysztof Iniewski. - Boca Raton :CRC Press,c2011. - xv, 415 p. :ill. ;25 cm. - Devices, circuits, and systems. - Devices, circuits, and systems..

Includes bibliographical references and index.

Radiation damage in silicon / Gianluigi Casse -- Radiation-tolerant CMOS single-photon imagers for multiradiation detection / Edoardo Charbon ... [et al.] -- Effects of hydrogen on the radiation response on field-oxide field-effect transistors and high-k dielectrics / Xing J. Zhou, Daniel M. Fleetwood, and Ronald D. Schrimpf -- Novel total dose and heavy-ion charge collection phenomena in a new SiGe HBT on thin-film SOI technology / Grégory Avenier ... [et al.] -- Radiation-hard voltage and current references in standard CMOS technologies / Vladimir Gromov and Anne-Johan Annema -- Nanocrystal memories : an evolutionary approach to flash memory scaling and a class of radiation-tolerant devices / Cosimo Gerardi ... [et al.] -- Radiation hardened by design SRAM strategies for TID and SEE mitigation / Lawrence T. Clark -- A complete guide to multiple upsets in SRAMs processed in decananometric CMOS technologies / Gilles Gasiot and Phillippe Roche -- Real-time soft error rate characterization of advanced SRAMs / Jean-Luc Autran ... [et al.] -- Fault tolerance techniques and reliability modeling for SRAM-based FPGAs / Keith S. Morgan ... [et al.] -- Assuring robust triple modular redundancy protected circuits in SRAM-based FPGAs / Michael Caffrey ... [et al.] -- SEU/SET tolerant phase-locked loops / Robert L. Shuler, Jr. -- Autonomous detection and characterization of radiation-induced transients in semiconductor integrated circuits / Balaji Narasimham ... [et al.] -- Soft errors in digital circuits : overview and protection techniques for digital filters / Pedro reviriego Vasallo and Juan Antonio Maestro -- Fault-injection techniques for dependability analysis : an overview / Massimo Violante.

ISBN: 1439826943 (cloth) :NT5001

LCCN: 2010011811

Nat. Bib. No.: GBB012255bnb

Nat. Bib. Agency Control No.: 015479214UkSubjects--Topical Terms:

886806
Photon emission.

LC Class. No.: TK7871.85 / .R317 2011

Dewey Class. No.: 621.3815/2

Radiation effects in semiconductors /
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650 # 0 $a Semiconductors $x Effect of radiation on. $3 886807
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