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High quality test pattern generation...
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SpringerLink (Online service)
High quality test pattern generation and boolean satisfiability
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
High quality test pattern generation and boolean satisfiability/ by Stephan EggersgluB, Rolf Drechsler.
作者:
Eggersgluss, Stephan.
其他作者:
Drechsler, Rolf.
出版者:
Boston, MA :Springer US, : 2012.,
面頁冊數:
xviii, 193 p. :ill., digital ; : 24 cm.;
Contained By:
Springer eBooks
標題:
Integrated circuits - Testing. -
電子資源:
http://dx.doi.org/10.1007/978-1-4419-9976-4
ISBN:
9781441999764 (electronic bk.)
High quality test pattern generation and boolean satisfiability
Eggersgluss, Stephan.
High quality test pattern generation and boolean satisfiability
[electronic resource] /by Stephan EggersgluB, Rolf Drechsler. - Boston, MA :Springer US,2012. - xviii, 193 p. :ill., digital ;24 cm.
ISBN: 9781441999764 (electronic bk.)Subjects--Topical Terms:
769159
Integrated circuits
--Testing.
LC Class. No.: TK7874 / .E34 2012
Dewey Class. No.: 621.395
High quality test pattern generation and boolean satisfiability
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