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Interfacial compatibility in microel...

Laurila, Tomi.

Interfacial compatibility in microelectronics = moving away from the trial and error approach /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Interfacial compatibility in microelectronics/ by Tomi Laurila ... [et al.].
Reminder of title:	moving away from the trial and error approach /
other author:	Laurila, Tomi.
Published:	London :Springer London, : 2012.,
Description:	ix, 217 p. :ill., digital ; : 24 cm.;
Contained By:	Springer eBooks
Subject:	Microelectronics. -
Online resource:	http://dx.doi.org/10.1007/978-1-4471-2470-2
ISBN:	9781447124702 (electronic bk.)

Interfacial compatibility in microelectronics = moving away from the trial and error approach /
Interfacial compatibility in microelectronicsmoving away from the trial and error approach /[electronic resource] :by Tomi Laurila ... [et al.]. - London :Springer London,2012. - ix, 217 p. :ill., digital ;24 cm. - Microsystems,1389-2134. - Microsystems..

ISBN: 9781447124702 (electronic bk.)Subjects--Topical Terms:

554956
Microelectronics.

LC Class. No.: TK7874 / .I58 2012

Dewey Class. No.: 621.381

Interfacial compatibility in microelectronics = moving away from the trial and error approach /
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245 0 0 $a Interfacial compatibility in microelectronics $h [electronic resource] : $b moving away from the trial and error approach / $c by Tomi Laurila ... [et al.].
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300 $a ix, 217 p. : $b ill., digital ; $c 24 cm.
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650 0 $a Microelectronics. $3 554956
650 1 4 $a Engineering. $3 561152
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650 2 4 $a Surfaces and Interfaces, Thin Films. $3 671207
650 2 4 $a Optical and Electronic Materials. $3 593919
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