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Characterization of microstructures ...
~
Rong, Yonghua.
Characterization of microstructures by analytical electron microscopy (AEM)
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Characterization of microstructures by analytical electron microscopy (AEM)/ by Yonghua Rong.
作者:
Rong, Yonghua.
出版者:
Berlin, Heidelberg :Springer Berlin Heidelberg, : 2012.,
面頁冊數:
xviii, 552 p. :ill., digital ; : 24 cm.;
Contained By:
Springer eBooks
標題:
Nanostructured materials - Nondestructive testing. -
電子資源:
http://dx.doi.org/10.1007/978-3-642-20119-6
ISBN:
9783642201196 (electronic bk.)
Characterization of microstructures by analytical electron microscopy (AEM)
Rong, Yonghua.
Characterization of microstructures by analytical electron microscopy (AEM)
[electronic resource] /by Yonghua Rong. - Berlin, Heidelberg :Springer Berlin Heidelberg,2012. - xviii, 552 p. :ill., digital ;24 cm.
ISBN: 9783642201196 (electronic bk.)Subjects--Topical Terms:
891771
Nanostructured materials
--Nondestructive testing.
LC Class. No.: TA417.23 / .R66 2012
Dewey Class. No.: 620.1157
Characterization of microstructures by analytical electron microscopy (AEM)
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