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SpringerLink (Online service)
Power-constrained testing of VLSI circuits
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Power-constrained testing of VLSI circuits/ by Nicola Nicolici and Bashir M. Al-Hashimi.
Author:
Nicolici, Nicola.
other author:
Al-Hashimi, Bashir.
Published:
Boston :Springer Science + Business Media, : c2004.,
Description:
xi, 178 p. :ill., digital ; : 25 cm.;
Series:
Frontiers in electronic testing ;
Contained By:
Springer e-books
Subject:
Integrated circuits, Very large scale integration - Testing. -
Online resource:
http://dx.doi.org/10.1007/b105922
ISBN:
9780306487316 (electronic bk.)
Power-constrained testing of VLSI circuits
Nicolici, Nicola.
Power-constrained testing of VLSI circuits
[electronic resource] /by Nicola Nicolici and Bashir M. Al-Hashimi. - Boston :Springer Science + Business Media,c2004. - xi, 178 p. :ill., digital ;25 cm. - Frontiers in electronic testing ;22.
ISBN: 9780306487316 (electronic bk.)Subjects--Topical Terms:
895125
Integrated circuits, Very large scale integration
--Testing.
LC Class. No.: TK7874.75 / .N53 2004
Dewey Class. No.: 621.3950287
Power-constrained testing of VLSI circuits
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