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High resolution electron microscopy ...

Dahmen, Ulrich.

High resolution electron microscopy of defects in materials : = symposium held April 16-18, 1990, San Francisco, California, U.S.A. /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	High resolution electron microscopy of defects in materials :/ editors, Robert Sinclair, David J. Smith, Ulrich Dahmen.
其他題名:	symposium held April 16-18, 1990, San Francisco, California, U.S.A. /
其他作者:	Dahmen, Ulrich.
出版者:	Pittsburgh, Pa. :Materials Research Society, : c1990.,
面頁冊數:	xi, 391 p. :ill. ; : 24 cm.;
標題:	High resolution electron microscopy - Congresses. -
ISBN:	1558990720 (cloth) :

High resolution electron microscopy of defects in materials : = symposium held April 16-18, 1990, San Francisco, California, U.S.A. /
High resolution electron microscopy of defects in materials :symposium held April 16-18, 1990, San Francisco, California, U.S.A. /editors, Robert Sinclair, David J. Smith, Ulrich Dahmen. - Pittsburgh, Pa. :Materials Research Society,c1990. - xi, 391 p. :ill. ;24 cm. - Materials Research Society symposium proceedings,v. 1830272-9172 ;. - Materials Research Society symposia proceedings ;v. 1352..

Includes bibliographical references and indexes.

ISBN: 1558990720 (cloth) :NT1172

LCCN: 90041466 Subjects--Topical Terms:

975577
High resolution electron microscopy
--Congresses.

LC Class. No.: TA417.23 / .H53 1990

Dewey Class. No.: 620.1/1299

High resolution electron microscopy of defects in materials : = symposium held April 16-18, 1990, San Francisco, California, U.S.A. /
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