國立虎尾科技大學 |

Language: English

Back

New approaches to image processing b...

Livshits, Pavel.

New approaches to image processing based failure analysis of nano-scale ULSI devices

Record Type:	Language materials, printed : Monograph/item
Title/Author:	New approaches to image processing based failure analysis of nano-scale ULSI devices/ Zeev Zalevsky, Pavel Livshits, Eran Gur.
Author:	Zalevsky, Zeev.
other author:	Livshits, Pavel.
Published:	Amsterdam :Elsevier/William Andrew, : 2014.,
Description:	101 p. :ill. ; : 23 cm.;
Subject:	Integrated circuits - Ultra large scale integration -
Online resource:	http://www.sciencedirect.com/science/book/9780323241434
ISBN:	9780323241434 (electronic bk.)

New approaches to image processing based failure analysis of nano-scale ULSI devices
Zalevsky, Zeev.

New approaches to image processing based failure analysis of nano-scale ULSI devices[electronic resource] /Zeev Zalevsky, Pavel Livshits, Eran Gur. - Amsterdam :Elsevier/William Andrew,2014. - 101 p. :ill. ;23 cm. - Micro & nano technologies series. - Micro & nano technologies..

Includes bibliographical references.

New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can't keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution of light, and imaging these features is nearly impossible even with electron microscopes, due to image noise.

ISBN: 9780323241434 (electronic bk.)Subjects--Topical Terms:

1004589
Integrated circuits
--Ultra large scale integration

LC Class. No.: TK7874.76 / .Z384 2014

Dewey Class. No.: 621.4

New approaches to image processing based failure analysis of nano-scale ULSI devices
LDR:01393cam a2200229 a 4500 001 797458
005 20140701165341.0
008 150518s2014 ne a sb 000 0 eng d
020 $a 9780323241434 (electronic bk.)
020 $a 9780323241434
035 $a (OCoLC)875166733
035 $a 14000370
040 $a IND $b eng $e rda $c IND $d BTCTA $d YDXCP $d UKMGB $d CDX $d OCLCO
041 0 $a eng
050 4 $a TK7874.76 $b .Z384 2014
082 0 4 $a 621.4 $2 23
100 1 $a Zalevsky, Zeev. $3 779153
245 1 0 $a New approaches to image processing based failure analysis of nano-scale ULSI devices $h [electronic resource] / $c Zeev Zalevsky, Pavel Livshits, Eran Gur.
260 $a Amsterdam : $b Elsevier/William Andrew, $c 2014.
300 $a 101 p. : $b ill. ; $c 23 cm.
490 1 $a Micro & nano technologies series
504 $a Includes bibliographical references.
520 $a New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can't keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution of light, and imaging these features is nearly impossible even with electron microscopes, due to image noise.
650 0 $a Integrated circuits $x Ultra large scale integration $x Testing. $3 1004589
650 0 $a Nanoelectronics. $3 574250
650 0 $a Microelectronics. $3 554956
700 1 $a Livshits, Pavel. $3 1004587
700 1 $a Gur, Eran. $3 1004588
830 0 $a Micro & nano technologies. $3 595748
856 4 0 $u http://www.sciencedirect.com/science/book/9780323241434

based on 0 review(s)

Multimedia

Reviews

Add a review and share your thoughts with other readers

Export

pickup library