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Robust speckle metrology : = techniq...
~
Albertazzi, Armando.
Robust speckle metrology : = techniques for stress analysis and NDT /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Robust speckle metrology :/ Matias R. Viotti, Armando Albertazzi, Jr.
Reminder of title:
techniques for stress analysis and NDT /
Author:
Viotti, Matias R.
other author:
Albertazzi, Armando.
Published:
Bellingham, Washington USA :SPIE Press, : c2014.,
Description:
xviii, 180 p. :ill. (some col.) ; : 26 cm.;
Subject:
Speckle metrology. -
ISBN:
9781628413182 (pbk.) :
Robust speckle metrology : = techniques for stress analysis and NDT /
Viotti, Matias R.
Robust speckle metrology :
techniques for stress analysis and NDT /Matias R. Viotti, Armando Albertazzi, Jr. - Bellingham, Washington USA :SPIE Press,c2014. - xviii, 180 p. :ill. (some col.) ;26 cm. - SPIE ;v. PM251.
Includes bibliographical references and index.
Preface -- List of symbols and notation -- 1. NDT applications in engineering -- 2. Principles of digital speckle pattern interferometry -- 3. Optical configurations for measurements using DSPI -- 4. Robust optical systems -- 5. Quantitative evaluation of stresses and strains -- 6. Quantitative evaluation of residual stresses -- 7. Qualitative fault detection and evaluation -- 8. Digital image correlation for structural monitoring -- 9. Closing remarks -- Index.
ISBN: 9781628413182 (pbk.) :NT1927
LCCN: 2014021899Subjects--Topical Terms:
912762
Speckle metrology.
LC Class. No.: TA418.7 / .V56 2014
Dewey Class. No.: 620.1/1230287
Robust speckle metrology : = techniques for stress analysis and NDT /
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Preface -- List of symbols and notation -- 1. NDT applications in engineering -- 2. Principles of digital speckle pattern interferometry -- 3. Optical configurations for measurements using DSPI -- 4. Robust optical systems -- 5. Quantitative evaluation of stresses and strains -- 6. Quantitative evaluation of residual stresses -- 7. Qualitative fault detection and evaluation -- 8. Digital image correlation for structural monitoring -- 9. Closing remarks -- Index.
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