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Interferometry for precision measure...
~
Langenbeck, Peter.
Interferometry for precision measurement /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Interferometry for precision measurement // Peter Langenbeck.
作者:
Langenbeck, Peter.
出版者:
Bellingham, Washington, USA :SPIE Press, : c2014.,
面頁冊數:
xiv, 243 p. :ill. (some col.) ; : 26 cm.;
標題:
Interferometry. -
ISBN:
9780819491404 (pbk.) :
Interferometry for precision measurement /
Langenbeck, Peter.
Interferometry for precision measurement /
Peter Langenbeck. - Bellingham, Washington, USA :SPIE Press,c2014. - xiv, 243 p. :ill. (some col.) ;26 cm. - Tutorial texts in optical engineering ;v. TT94.
Includes bibliographical references and index.
Known methods : an assessment of the state of the art, Newton and Fizeau -- From extended light source to collimated illumination -- Interferences visualized by vector diagrams -- Optical laboratory equipment -- Straight lines and right angles -- Polygons -- Optical shop daily tasks -- Specular technical mass-produced surfaces -- Non-specular, near-flat, mass-produced surfaces -- Enhancing regular interferometric sensitivity.
ISBN: 9780819491404 (pbk.) :NT2156
LCCN: 2013031940Subjects--Topical Terms:
643415
Interferometry.
LC Class. No.: QC411 / .L24 2014
Dewey Class. No.: 535/.470287
Interferometry for precision measurement /
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