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Fringe pattern analysis for optical ...

Servin, Manuel.

Fringe pattern analysis for optical metrology = theory, algorithms, and applications /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Fringe pattern analysis for optical metrology/ Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla.
Reminder of title:	theory, algorithms, and applications /
Author:	Servin, Manuel.
other author:	Quiroga, J. Antonio
Published:	Weinheim :Wiley-VCH, : 2014.,
Description:	1 online resource (xvi, 328 p.) :ill. :
Subject:	Interferometry. -
Online resource:	http://onlinelibrary.wiley.com/book/10.1002/9783527681075
ISBN:	1306840880$q(electronic bk.)

Fringe pattern analysis for optical metrology = theory, algorithms, and applications /
Servin, Manuel.

Fringe pattern analysis for optical metrologytheory, algorithms, and applications /[electronic resource] :Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla. - 1st ed. - Weinheim :Wiley-VCH,2014. - 1 online resource (xvi, 328 p.) :ill.

Includes bibliographical references and index.

ISBN: 1306840880$q(electronic bk.)Subjects--Topical Terms:

643415
Interferometry.

LC Class. No.: QC39 / .S384 2014

Dewey Class. No.: 530.8

Fringe pattern analysis for optical metrology = theory, algorithms, and applications /
LDR:01378cam a2200373Ii 4500 001 833108
003 OCoLC
005 20151014043845.0
006 m o d
007 cr |||||||||||
008 160215s2014 gw a ob 001 0 eng d
020 $a 1306840880$q(electronic bk.)
020 $a 9781306840880$q(electronic bk.)
020 $a 9783527681082$q(electronic bk.)
020 $a 3527681086$q(electronic bk.)
020 $a 9783527681075$q(electronic bk.)
020 $z 3527681078
020 $z 9783527681099
020 $z 3527681094
020 $z 9783527411528$q(print)
020 $a 3527411526
020 $a 9783527681105 (ePub)
020 $a 3527681108 (ePub)
035 $a (OCoLC)881028799
035 $a ocn881028799
040 $a IDEBK $b eng $c IDEBK $d EBLCP $d E7B $d DG1 $d CUI $d N $d OCLCA $d OCLCQ $d OCLCF $d DEBSZ $d COO
050 4 $a QC39 $b .S384 2014
082 0 4 $a 530.8
100 1 $a Servin, Manuel. $3 1060408
245 1 0 $a Fringe pattern analysis for optical metrology $h [electronic resource] : $b theory, algorithms, and applications / $c Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla.
250 $a 1st ed.
260 $a Weinheim : $b Wiley-VCH, $c 2014.
300 $a 1 online resource (xvi, 328 p.) : $b ill.
504 $a Includes bibliographical references and index.
588 0 $a Online resource; title from PDF title page (Wiley, viewed August 1, 2014).
650 0 $a Interferometry. $3 643415
650 0 $a Diffraction patterns. $3 897651
650 0 $a Optical measurements. $3 643414
700 1 $a Quiroga, J. Antonio $q (Juan Antonio) $3 1060409
700 1 $a Padilla, J. Moisés $q (José Moisés) $3 1060410
856 4 0 $u http://onlinelibrary.wiley.com/book/10.1002/9783527681075

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