Language:
English
繁體中文
Help
Login
Back
Switch To:
Labeled
|
MARC Mode
|
ISBD
MEMS and nanotechnology. = proceedin...
~
SpringerLink (Online service)
MEMS and nanotechnology. = proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics /. Volume 8
Record Type:
Language materials, printed : Monograph/item
Title/Author:
MEMS and nanotechnology./ edited by Barton C. Prorok ... [et al.].
Reminder of title:
proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics /
other author:
Prorok, Barton C.
corporate name:
Workshop on the Preservation of Stability under Discretization
Published:
Cham :Springer International Publishing : : 2015.,
Description:
vii, 83 p. :ill., digital ; : 24 cm.;
Contained By:
Springer eBooks
Subject:
Nanotechnology - Textbooks. -
Online resource:
http://dx.doi.org/10.1007/978-3-319-07004-9
ISBN:
9783319070049 (electronic bk.)
MEMS and nanotechnology. = proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics /. Volume 8
MEMS and nanotechnology.
proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics /Volume 8[electronic resource] :edited by Barton C. Prorok ... [et al.]. - Cham :Springer International Publishing :2015. - vii, 83 p. :ill., digital ;24 cm. - Conference proceedings of the Society for Experimental Mechanics series,2191-5644. - Conference proceedings of the Society for Experimental Mechanics series..
Newly Discovered Pile Up Effects During Nanoindentation -- Spring Constant Characterization of a Thermally Tunable MEMS Regressive Spring -- Shape Optimization of Cantilevered Devices for Piezoelectric Energy Harvesting -- Bonded Hemishell Approach to Encapsulate Microdevices in Spheroidal Packages -- Development of an Infrared Direct Viewer Based on a MEMS Focal Plane Array -- Modeling and Testing RF Meta-Atom Designs for Rapid Metamaterial Prototyping -- Pyroelectric AlN Thin Films Used as a MEMS IR Sensing Material -- In Situ Energy Loss and Internal Friction Measurement of Nanocrystalline Copper Thin Films Under Different Temperature -- Effect of Current Density and Magnetic Field on the Growth and Morphology of Nickel Nanowires.
MEMS and Nanotechnology, Volume 8: Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics, the eighth volume of eight from the Conference, brings together contributions to this important area of research and engineering. The collection presents early findings and case studies on a wide range of areas, including: Small-Scale Plasticity MEMS and Electronic Packaging Mechanics of Graphene Interfacial Mechanics Methods in Measuring Small-Scale Displacements Organic and Inorganic Nanowires AFM and Resonant-Based Methods Thin Films and Nanofibers.
ISBN: 9783319070049 (electronic bk.)
Standard No.: 10.1007/978-3-319-07004-9doiSubjects--Topical Terms:
636428
Nanotechnology
--Textbooks.
LC Class. No.: T174.7
Dewey Class. No.: 620.5
MEMS and nanotechnology. = proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics /. Volume 8
LDR
:02415nam a2200325 a 4500
001
834171
003
DE-He213
005
20150520162113.0
006
m d
007
cr nn 008maaau
008
160421s2015 gw s 0 eng d
020
$a
9783319070049 (electronic bk.)
020
$a
9783319070032 (paper)
024
7
$a
10.1007/978-3-319-07004-9
$2
doi
035
$a
978-3-319-07004-9
040
$a
GP
$c
GP
041
0
$a
eng
050
4
$a
T174.7
072
7
$a
TDPB
$2
bicssc
072
7
$a
TEC027000
$2
bisacsh
082
0 4
$a
620.5
$2
23
090
$a
T174.7
$b
.A615 2014
111
2
$a
Workshop on the Preservation of Stability under Discretization
$d
(2001 :
$c
Fort Collins, Colo.)
$3
527686
245
1 0
$a
MEMS and nanotechnology.
$n
Volume 8
$h
[electronic resource] :
$b
proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics /
$c
edited by Barton C. Prorok ... [et al.].
260
$a
Cham :
$c
2015.
$b
Springer International Publishing :
$b
Imprint: Springer,
300
$a
vii, 83 p. :
$b
ill., digital ;
$c
24 cm.
490
1
$a
Conference proceedings of the Society for Experimental Mechanics series,
$x
2191-5644
505
0
$a
Newly Discovered Pile Up Effects During Nanoindentation -- Spring Constant Characterization of a Thermally Tunable MEMS Regressive Spring -- Shape Optimization of Cantilevered Devices for Piezoelectric Energy Harvesting -- Bonded Hemishell Approach to Encapsulate Microdevices in Spheroidal Packages -- Development of an Infrared Direct Viewer Based on a MEMS Focal Plane Array -- Modeling and Testing RF Meta-Atom Designs for Rapid Metamaterial Prototyping -- Pyroelectric AlN Thin Films Used as a MEMS IR Sensing Material -- In Situ Energy Loss and Internal Friction Measurement of Nanocrystalline Copper Thin Films Under Different Temperature -- Effect of Current Density and Magnetic Field on the Growth and Morphology of Nickel Nanowires.
520
$a
MEMS and Nanotechnology, Volume 8: Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics, the eighth volume of eight from the Conference, brings together contributions to this important area of research and engineering. The collection presents early findings and case studies on a wide range of areas, including: Small-Scale Plasticity MEMS and Electronic Packaging Mechanics of Graphene Interfacial Mechanics Methods in Measuring Small-Scale Displacements Organic and Inorganic Nanowires AFM and Resonant-Based Methods Thin Films and Nanofibers.
650
0
$a
Nanotechnology
$v
Textbooks.
$3
636428
$3
728179
650
0
$a
Microelectromechanical systems
$v
Congresses.
$3
679420
$3
742908
650
0
$a
Mechanics, Applied
$v
Congresses.
$3
787952
650
1 4
$a
Engineering.
$3
561152
650
2 4
$a
Nanotechnology and Microengineering.
$3
722030
650
2 4
$a
Nanotechnology.
$3
557660
650
2 4
$a
Theoretical and Applied Mechanics.
$3
670861
700
1
$a
Prorok, Barton C.
$3
1062425
710
2
$a
SpringerLink (Online service)
$3
593884
773
0
$t
Springer eBooks
830
0
$a
Conference proceedings of the Society for Experimental Mechanics series.
$3
1019729
856
4 0
$u
http://dx.doi.org/10.1007/978-3-319-07004-9
950
$a
Engineering (Springer-11647)
based on 0 review(s)
Multimedia
Reviews
Add a review
and share your thoughts with other readers
Export
pickup library
Processing
...
Change password
Login