國立虎尾科技大學 |

Comparators in nanometer CMOS technology

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Comparators in nanometer CMOS technology/ by Bernhard Goll, Horst Zimmermann.
Author:	Goll, Bernhard.
other author:	Zimmermann, Horst.
Published:	Berlin, Heidelberg :Springer Berlin Heidelberg : : 2015.,
Description:	xiv, 250 p. :ill. (some col.), digital ; : 24 cm.;
Contained By:	Springer eBooks
Subject:	Analog CMOS integrated circuits. -
Online resource:	http://dx.doi.org/10.1007/978-3-662-44482-5
ISBN:	9783662444825 (electronic bk.)

Comparators in nanometer CMOS technology
Goll, Bernhard.

Comparators in nanometer CMOS technology[electronic resource] /by Bernhard Goll, Horst Zimmermann. - Berlin, Heidelberg :Springer Berlin Heidelberg :2015. - xiv, 250 p. :ill. (some col.), digital ;24 cm. - Springer series in advanced microelectronics,v.501437-0387 ;. - Springer series in advanced microelectronics ;33..

Fundamentals of clocked, regenerative comparators -- State-of-the-art nanometer CMOS -- Measurement circuits and setup -- Comparators in 120 nm CMOS -- Comparators in 65 nm CMOS -- Conclusions and comparison.

This book covers the complete spectrum of the fundamentals of clocked, regenerative comparators, their state-of-the-art, advanced CMOS technologies, innovative comparators inclusive circuit aspects, their characterization and properties. Starting from the basics of comparators and the transistor characteristics in nanometer CMOS, seven high-performance comparators developed by the authors in 120nm and 65nm CMOS are described extensively. Methods and measurement circuits for the characterization of advanced comparators are introduced. A synthesis of the largely differing aspects of demands on modern comparators and the properties of devices being available in nanometer CMOS, which are posed by the so-called nanometer hell of physics, is accomplished. The book summarizes the state of the art in integrated comparators. Advanced measurement circuits for characterization will be introduced as well as the method of characterization by bit-error analysis usually being used for characterization of optical receivers. The book is compact, and the graphical quality of the illustrations is outstanding. This book is written for engineers and researchers in industry as well as scientists and Ph.D students at universities. It is also recommendable to graduate students specializing on nanoelectronics and microelectronics or circuit design.

ISBN: 9783662444825 (electronic bk.)

Standard No.: 10.1007/978-3-662-44482-5doiSubjects--Topical Terms:

1062812
Analog CMOS integrated circuits.

LC Class. No.: TK7874.654

Dewey Class. No.: 621.3815

Comparators in nanometer CMOS technology
LDR:02590nam a2200325 a 4500 001 834391
003 DE-He213
005 20150603160743.0
006 m d
007 cr nn 008maaau
008 160421s2015 gw s 0 eng d
020 $a 9783662444825 (electronic bk.)
020 $a 9783662444818 (paper)
024 7 $a 10.1007/978-3-662-44482-5 $2 doi
035 $a 978-3-662-44482-5
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7874.654
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
082 0 4 $a 621.3815 $2 23
090 $a TK7874.654 $b .G626 2015
100 1 $a Goll, Bernhard. $3 1062811
245 1 0 $a Comparators in nanometer CMOS technology $h [electronic resource] / $c by Bernhard Goll, Horst Zimmermann.
260 $a Berlin, Heidelberg : $c 2015. $b Springer Berlin Heidelberg : $b Imprint: Springer,
300 $a xiv, 250 p. : $b ill. (some col.), digital ; $c 24 cm.
490 1 $a Springer series in advanced microelectronics, $x 1437-0387 ; $v v.50
505 0 $a Fundamentals of clocked, regenerative comparators -- State-of-the-art nanometer CMOS -- Measurement circuits and setup -- Comparators in 120 nm CMOS -- Comparators in 65 nm CMOS -- Conclusions and comparison.
520 $a This book covers the complete spectrum of the fundamentals of clocked, regenerative comparators, their state-of-the-art, advanced CMOS technologies, innovative comparators inclusive circuit aspects, their characterization and properties. Starting from the basics of comparators and the transistor characteristics in nanometer CMOS, seven high-performance comparators developed by the authors in 120nm and 65nm CMOS are described extensively. Methods and measurement circuits for the characterization of advanced comparators are introduced. A synthesis of the largely differing aspects of demands on modern comparators and the properties of devices being available in nanometer CMOS, which are posed by the so-called nanometer hell of physics, is accomplished. The book summarizes the state of the art in integrated comparators. Advanced measurement circuits for characterization will be introduced as well as the method of characterization by bit-error analysis usually being used for characterization of optical receivers. The book is compact, and the graphical quality of the illustrations is outstanding. This book is written for engineers and researchers in industry as well as scientists and Ph.D students at universities. It is also recommendable to graduate students specializing on nanoelectronics and microelectronics or circuit design.
650 0 $a Analog CMOS integrated circuits. $3 1062812
650 0 $a Microelectronics. $3 554956
650 1 4 $a Engineering. $3 561152
650 2 4 $a Circuits and Systems. $3 670901
650 2 4 $a Nuclear Physics, Heavy Ions, Hadrons. $3 672685
650 2 4 $a Nanotechnology and Microengineering. $3 722030
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 670219
650 2 4 $a Characterization and Evaluation of Materials. $3 674449
700 1 $a Zimmermann, Horst. $3 1019767
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer eBooks
830 0 $a Springer series in advanced microelectronics ; $v 33. $3 888202
856 4 0 $u http://dx.doi.org/10.1007/978-3-662-44482-5
950 $a Engineering (Springer-11647)