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Radiation-tolerant delta-sigma time-to-digital converters

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Radiation-tolerant delta-sigma time-to-digital converters/ by Ying Cao, Paul Leroux, Michiel Steyaert.
Author:	Cao, Ying.
other author:	Leroux, Paul.
Published:	Cham :Springer International Publishing : : 2015.,
Description:	xix, 114 p. :ill. (some col.), digital ; : 24 cm.;
Contained By:	Springer eBooks
Subject:	Metal oxide semiconductors, Complementary. -
Online resource:	http://dx.doi.org/10.1007/978-3-319-11842-0
ISBN:	9783319118420 (electronic bk.)

Radiation-tolerant delta-sigma time-to-digital converters
Cao, Ying.

Radiation-tolerant delta-sigma time-to-digital converters[electronic resource] /by Ying Cao, Paul Leroux, Michiel Steyaert. - Cham :Springer International Publishing :2015. - xix, 114 p. :ill. (some col.), digital ;24 cm. - Analog circuits and signal processing series,1872-082X. - Analog circuits and signal processing series..

Introduction -- Background on Time-to-Digital Converters -- Radiation-Hardened-by-Design -- The MASH DS Time-to-Digital Converter -- Radiation Hardened Bandgap References -- Low-Jitter Relaxation Oscillators -- Conclusions.

This book focuses on the design of a Mega-Gray (a standard unit of total ionizing radiation) radiation-tolerant ps-resolution time-to-digital converter (TDC) for a light detection and ranging (LIDAR) system used in a gamma-radiation environment. Several radiation-hardened-by-design (RHBD) techniques are demonstrated throughout the design of the TDC and other circuit techniques to improve the TDC's resolution in a harsh environment are also investigated. Readers can learn from scratch how to design a radiation-tolerant IC. Information regarding radiation effects, radiation-hardened design techniques and measurements are organized in such a way that readers can easily gain a thorough understanding of the topic. Readers will also learn the design theory behind the newly proposed delta-sigma TDC. Readers can quickly acquire knowledge about the design of radiation-hardened bandgap voltage references and low-jitter relaxation oscillators, which are introduced in the content from a designer's perspective. Discusses important aspects of radiation-tolerant analog IC design, including realistic applications and radiation effects on ICs; Demonstrates radiation-hardened-by-design techniques through a design-test-radiation assessment practice; Describes a new type of Time-to-Digital (TDC) converter designed for radiation-tolerant application; Explains the design and measurement of all functional blocks (e.g., bandgap reference, relaxation oscillator) in the TDC.

ISBN: 9783319118420 (electronic bk.)

Standard No.: 10.1007/978-3-319-11842-0doiSubjects--Topical Terms:

596746
Metal oxide semiconductors, Complementary.

LC Class. No.: TK7871.99.M44

Dewey Class. No.: 621.3815322

Radiation-tolerant delta-sigma time-to-digital converters
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520 $a This book focuses on the design of a Mega-Gray (a standard unit of total ionizing radiation) radiation-tolerant ps-resolution time-to-digital converter (TDC) for a light detection and ranging (LIDAR) system used in a gamma-radiation environment. Several radiation-hardened-by-design (RHBD) techniques are demonstrated throughout the design of the TDC and other circuit techniques to improve the TDC's resolution in a harsh environment are also investigated. Readers can learn from scratch how to design a radiation-tolerant IC. Information regarding radiation effects, radiation-hardened design techniques and measurements are organized in such a way that readers can easily gain a thorough understanding of the topic. Readers will also learn the design theory behind the newly proposed delta-sigma TDC. Readers can quickly acquire knowledge about the design of radiation-hardened bandgap voltage references and low-jitter relaxation oscillators, which are introduced in the content from a designer's perspective. Discusses important aspects of radiation-tolerant analog IC design, including realistic applications and radiation effects on ICs; Demonstrates radiation-hardened-by-design techniques through a design-test-radiation assessment practice; Describes a new type of Time-to-Digital (TDC) converter designed for radiation-tolerant application; Explains the design and measurement of all functional blocks (e.g., bandgap reference, relaxation oscillator) in the TDC.
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