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Ellipsometry at the nanoscale
~
Hingerl, Kurt.
Ellipsometry at the nanoscale
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Ellipsometry at the nanoscale/ edited by Maria Losurdo, Kurt Hingerl.
other author:
Losurdo, Maria.
Published:
Berlin, Heidelberg :Springer Berlin Heidelberg : : 2013.,
Description:
xxiv, 730 p. :ill., digital ; : 24 cm.;
Contained By:
Springer eBooks
Subject:
Ellipsometry. -
Online resource:
http://dx.doi.org/10.1007/978-3-642-33956-1
ISBN:
9783642339561 (electronic bk.)
Ellipsometry at the nanoscale
Ellipsometry at the nanoscale
[electronic resource] /edited by Maria Losurdo, Kurt Hingerl. - Berlin, Heidelberg :Springer Berlin Heidelberg :2013. - xxiv, 730 p. :ill., digital ;24 cm.
ISBN: 9783642339561 (electronic bk.)Subjects--Topical Terms:
904832
Ellipsometry.
LC Class. No.: QC443 / .E45 2013
Dewey Class. No.: 620.11295
Ellipsometry at the nanoscale
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[electronic resource] /
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edited by Maria Losurdo, Kurt Hingerl.
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Berlin, Heidelberg :
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2013.
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Springer Berlin Heidelberg :
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Imprint: Springer,
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xxiv, 730 p. :
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ill., digital ;
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24 cm.
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Ellipsometry.
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Polarimetry.
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Nanotechnology and Microengineering.
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Measurement Science and Instrumentation.
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Characterization and Evaluation of Materials.
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Losurdo, Maria.
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Hingerl, Kurt.
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http://dx.doi.org/10.1007/978-3-642-33956-1
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Engineering (Springer-11647)
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