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Photo-excited charge collection spectroscopy = probing the traps in field-effect transistors /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Photo-excited charge collection spectroscopy/ by Seongil Im, Youn-Gyoung Chang, Jae Hoon Kim.
Reminder of title:	probing the traps in field-effect transistors /
Author:	Im, Seongil.
other author:	Chang, Youn-Gyoung.
Published:	Dordrecht :Springer Netherlands : : 2013.,
Description:	xi, 101 p. :ill., digital ; : 24 cm.;
Contained By:	Springer eBooks
Subject:	Field-effect transistors. -
Online resource:	http://dx.doi.org/10.1007/978-94-007-6392-0
ISBN:	9789400763920 (electronic bk.)

Photo-excited charge collection spectroscopy = probing the traps in field-effect transistors /
Im, Seongil.

Photo-excited charge collection spectroscopyprobing the traps in field-effect transistors /[electronic resource] :by Seongil Im, Youn-Gyoung Chang, Jae Hoon Kim. - Dordrecht :Springer Netherlands :2013. - xi, 101 p. :ill., digital ;24 cm. - SpringerBriefs in physics,2191-5423. - SpringerBriefs in physics..

ISBN: 9789400763920 (electronic bk.)Subjects--Topical Terms:

1021068
Field-effect transistors.

LC Class. No.: TK7871.95 / .I4 2013

Dewey Class. No.: 621.3815284

Photo-excited charge collection spectroscopy = probing the traps in field-effect transistors /
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