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Photo-excited charge collection spec...
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SpringerLink (Online service)
Photo-excited charge collection spectroscopy = probing the traps in field-effect transistors /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Photo-excited charge collection spectroscopy/ by Seongil Im, Youn-Gyoung Chang, Jae Hoon Kim.
其他題名:
probing the traps in field-effect transistors /
作者:
Im, Seongil.
其他作者:
Chang, Youn-Gyoung.
出版者:
Dordrecht :Springer Netherlands : : 2013.,
面頁冊數:
xi, 101 p. :ill., digital ; : 24 cm.;
Contained By:
Springer eBooks
標題:
Field-effect transistors. -
電子資源:
http://dx.doi.org/10.1007/978-94-007-6392-0
ISBN:
9789400763920 (electronic bk.)
Photo-excited charge collection spectroscopy = probing the traps in field-effect transistors /
Im, Seongil.
Photo-excited charge collection spectroscopy
probing the traps in field-effect transistors /[electronic resource] :by Seongil Im, Youn-Gyoung Chang, Jae Hoon Kim. - Dordrecht :Springer Netherlands :2013. - xi, 101 p. :ill., digital ;24 cm. - SpringerBriefs in physics,2191-5423. - SpringerBriefs in physics..
ISBN: 9789400763920 (electronic bk.)Subjects--Topical Terms:
1021068
Field-effect transistors.
LC Class. No.: TK7871.95 / .I4 2013
Dewey Class. No.: 621.3815284
Photo-excited charge collection spectroscopy = probing the traps in field-effect transistors /
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