| Record Type: |
Language materials, printed
: Monograph/item
|
| Title/Author: |
發明專利實體審查基準 =/ 張仁平編著. |
| Reminder of title: |
Guidelines for substantive examination of invention patent / |
| remainder title: |
Guidelines for substantive examination of invention patent |
| Author: |
張仁平. |
| Published: |
臺北市 :經濟部智慧局, : 2015.02印刷., |
| Description: |
[11], 377面 :圖 ; : 21公分.; |
| Notes: |
2015.02二刷. |
| Subject: |
發明. - |
| ISBN: |
9789860404630 (平裝) : |