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Fundamental & applied problems of te...
~
State University of New York at Buffalo.
Fundamental & applied problems of terahertz devices and technologies = selected papers from the Russia-Japan-USA symposium (RJUS TeraTech-2014) /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Fundamental & applied problems of terahertz devices and technologies/ editor, Michael Shur.
Reminder of title:
selected papers from the Russia-Japan-USA symposium (RJUS TeraTech-2014) /
remainder title:
Fundamental and applied problems of terahertz devices and technologies
corporate name:
Workshop on the Preservation of Stability under Discretization
Published:
New Jersey :World Scientific, : 2016.,
Description:
1 online resource (vii, 93 p.) :ill. (some col.) :
Notes:
Papers from the third Russia-Japan-USA Symposium on Fundamental & Applied Problems of Terahertz Devices and Technologies "RJUS TeraTech-2014" held June 17-21, 2014 at the University at Buffalo, NY, USA.
Subject:
Terahertz technology - Handbooks, manuals, etc. -
Online resource:
http://www.worldscientific.com/worldscibooks/10.1142/9819#t=toc
ISBN:
9789814725200 (electronic bk.)
Fundamental & applied problems of terahertz devices and technologies = selected papers from the Russia-Japan-USA symposium (RJUS TeraTech-2014) /
Fundamental & applied problems of terahertz devices and technologies
selected papers from the Russia-Japan-USA symposium (RJUS TeraTech-2014) /[electronic resource] :Fundamental and applied problems of terahertz devices and technologieseditor, Michael Shur. - New Jersey :World Scientific,2016. - 1 online resource (vii, 93 p.) :ill. (some col.) - Selected topics in electronics and systems ;v. 56. - Selected topics in electronics and systems ;v. 51..
Papers from the third Russia-Japan-USA Symposium on Fundamental & Applied Problems of Terahertz Devices and Technologies "RJUS TeraTech-2014" held June 17-21, 2014 at the University at Buffalo, NY, USA.
Includes bibliographical references and index.
ISBN: 9789814725200 (electronic bk.)
LCCN: 2015031942Subjects--Topical Terms:
877435
Terahertz technology
--Handbooks, manuals, etc.
LC Class. No.: QC454.T47 / S96 2014
Dewey Class. No.: 621.381/3
Fundamental & applied problems of terahertz devices and technologies = selected papers from the Russia-Japan-USA symposium (RJUS TeraTech-2014) /
LDR
:01408cam a2200301 a 4500
001
857898
003
OCoLC
005
20160606041221.8
006
m o d
007
cr |n|---|||||
008
170421s2016 njua ob 101 0 eng
010
$a
2015031942
020
$a
9789814725200 (electronic bk.)
020
$z
9789814725194 (hardcover)
035
$a
(OCoLC)925354990
035
$a
925354990
040
$a
DLC
$b
eng
$c
DLC
$d
BTCTA
$d
OCLCQ
050
4
$a
QC454.T47
$b
S96 2014
082
0 0
$a
621.381/3
$2
23
111
2
$a
Workshop on the Preservation of Stability under Discretization
$d
(2001 :
$c
Fort Collins, Colo.)
$3
527686
245
1 0
$a
Fundamental & applied problems of terahertz devices and technologies
$h
[electronic resource] :
$b
selected papers from the Russia-Japan-USA symposium (RJUS TeraTech-2014) /
$c
editor, Michael Shur.
246
3 0
$a
Fundamental and applied problems of terahertz devices and technologies
246
3 0
$a
Terahertz devices and technologies
260
$a
New Jersey :
$b
World Scientific,
$c
2016.
300
$a
1 online resource (vii, 93 p.) :
$b
ill. (some col.)
490
1
$a
Selected topics in electronics and systems ;
$v
v. 56
500
$a
Papers from the third Russia-Japan-USA Symposium on Fundamental & Applied Problems of Terahertz Devices and Technologies "RJUS TeraTech-2014" held June 17-21, 2014 at the University at Buffalo, NY, USA.
504
$a
Includes bibliographical references and index.
588
$a
Description based on print version record.
650
0
$a
Terahertz technology
$v
Handbooks, manuals, etc.
$3
877435
650
0
$a
Submilimeter waves
$v
Congresses.
$3
1098741
710
2
$a
State University of New York at Buffalo.
$3
1098740
830
0
$a
Selected topics in electronics and systems ;
$v
v. 51.
$3
857297
856
4 0
$u
http://www.worldscientific.com/worldscibooks/10.1142/9819#t=toc
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