國立虎尾科技大學 |

Development of infrared techniques for practical defect identification in bonded joints

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Development of infrared techniques for practical defect identification in bonded joints/ by Rachael C. Waugh.
作者:	Waugh, Rachael C.
出版者:	Cham :Springer International Publishing : : 2016.,
面頁冊數:	xxviii, 149 p. :ill., digital ; : 24 cm.;
Contained By:	Springer eBooks
標題:	Infrared testing. -
電子資源:	http://dx.doi.org/10.1007/978-3-319-22982-9
ISBN:	9783319229829

Development of infrared techniques for practical defect identification in bonded joints
Waugh, Rachael C.

Development of infrared techniques for practical defect identification in bonded joints[electronic resource] /by Rachael C. Waugh. - Cham :Springer International Publishing :2016. - xxviii, 149 p. :ill., digital ;24 cm. - Springer theses,2190-5053. - Springer theses..

Introduction -- Adhesive bonding -- Non-destructive evaluation -- The physics and implementation of thermography -- Preliminary results -- Numerical modelling -- Kissing defects -- Practical application of PT/PPT -- Industrial applications -- Conclusions and future work.

Maximizing reader insights into the use of thermography, specifically pulsed and pulse phase thermography (PT and PPT), for the identification of kissing defects in adhesive bonds, this thesis focuses on the application of PT and PPT for the identification of a range of defect types in a variety of materials to establish the effect of material properties on identification of defects. Featuring analysis of a numerical model developed to simulate the thermal evolution created during a PT or PPT experiment, after validation through a series of case studies, this model is then used as a predictive tool to relate defect detectability to the thermal property contrast between defect and bulk materials. Demonstrating a means of producing realistic kissing defects in bonded joints where insufficient thermal property contrast exists defects have a limited effect on heat propagation through a component and therefore are not detected using PT or PPT, this thesis discusses the addition of a small load to bonds containing kissing defects which was found to open the defects sufficiently to enable their detection. A low cost infrared detector, Flir Tau320, is compared to the research based photon detector, Flir SC5000, and is shown to be suitable for application in PT, thus enabling a significantly lower cost tool to be developed.

ISBN: 9783319229829

Standard No.: 10.1007/978-3-319-22982-9doiSubjects--Topical Terms:

1102190
Infrared testing.

LC Class. No.: TA417.5

Dewey Class. No.: 620.1127

Development of infrared techniques for practical defect identification in bonded joints
LDR:02632nam a2200325 a 4500 001 860510
003 DE-He213
005 20160726153818.0
006 m d
007 cr nn 008maaau
008 170720s2016 gw s 0 eng d
020 $a 9783319229829 $q (electronic bk.)
020 $a 9783319229812 $q (paper)
024 7 $a 10.1007/978-3-319-22982-9 $2 doi
035 $a 978-3-319-22982-9
040 $a GP $c GP
041 0 $a eng
050 4 $a TA417.5
072 7 $a TGMT $2 bicssc
072 7 $a TEC021000 $2 bisacsh
082 0 4 $a 620.1127 $2 23
090 $a TA417.5 $b .W354 2016
100 1 $a Waugh, Rachael C. $3 1102189
245 1 0 $a Development of infrared techniques for practical defect identification in bonded joints $h [electronic resource] / $c by Rachael C. Waugh.
260 $a Cham : $c 2016. $b Springer International Publishing : $b Imprint: Springer,
300 $a xxviii, 149 p. : $b ill., digital ; $c 24 cm.
490 1 $a Springer theses, $x 2190-5053
505 0 $a Introduction -- Adhesive bonding -- Non-destructive evaluation -- The physics and implementation of thermography -- Preliminary results -- Numerical modelling -- Kissing defects -- Practical application of PT/PPT -- Industrial applications -- Conclusions and future work.
520 $a Maximizing reader insights into the use of thermography, specifically pulsed and pulse phase thermography (PT and PPT), for the identification of kissing defects in adhesive bonds, this thesis focuses on the application of PT and PPT for the identification of a range of defect types in a variety of materials to establish the effect of material properties on identification of defects. Featuring analysis of a numerical model developed to simulate the thermal evolution created during a PT or PPT experiment, after validation through a series of case studies, this model is then used as a predictive tool to relate defect detectability to the thermal property contrast between defect and bulk materials. Demonstrating a means of producing realistic kissing defects in bonded joints where insufficient thermal property contrast exists defects have a limited effect on heat propagation through a component and therefore are not detected using PT or PPT, this thesis discusses the addition of a small load to bonds containing kissing defects which was found to open the defects sufficiently to enable their detection. A low cost infrared detector, Flir Tau320, is compared to the research based photon detector, Flir SC5000, and is shown to be suitable for application in PT, thus enabling a significantly lower cost tool to be developed.
650 0 $a Infrared testing. $3 1102190
650 0 $a Nondestructive testing. $3 592680
650 1 4 $a Materials Science. $3 671087
650 2 4 $a Characterization and Evaluation of Materials. $3 674449
650 2 4 $a Quality Control, Reliability, Safety and Risk. $3 671184
650 2 4 $a Surface and Interface Science, Thin Films. $3 782551
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer eBooks
830 0 $a Springer theses. $3 831604
856 4 0 $u http://dx.doi.org/10.1007/978-3-319-22982-9
950 $a Chemistry and Materials Science (Springer-11644)