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The boundary-scan handbook
~
Parker, Kenneth P.
The boundary-scan handbook
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
The boundary-scan handbook/ by Kenneth P. Parker.
作者:
Parker, Kenneth P.
出版者:
Cham :Springer International Publishing : : 2016.,
面頁冊數:
xxxiv, 552 p. :ill., digital ; : 24 cm.;
Contained By:
Springer eBooks
標題:
Printed circuits - Testing. -
電子資源:
http://dx.doi.org/10.1007/978-3-319-01174-5
ISBN:
9783319011745
The boundary-scan handbook
Parker, Kenneth P.
The boundary-scan handbook
[electronic resource] /by Kenneth P. Parker. - 4th ed. - Cham :Springer International Publishing :2016. - xxxiv, 552 p. :ill., digital ;24 cm.
Boundary-Scan Basics And Vocabulary -- Boundary-Scan Description Language (BSDL) -- Boundary-Scan Testing -- Advanced Boundary-Scan Topics -- Design for Boundary-Scan Test -- Analog Measurement Basics -- IEEE 1149.4 Analog Boundary-Scan -- IEEE 1149.6 Testing Advanced I/O -- IEEE 1532:In-System Configuration -- IEEE 1149.8.1: Passive Components -- IEEE 1149.1:The 2013 Revision -- IEEE 1149.6: The 2015 Revision.
ISBN: 9783319011745
Standard No.: 10.1007/978-3-319-01174-5doiSubjects--Topical Terms:
1102628
Printed circuits
--Testing.
LC Class. No.: TK7868.P7
Dewey Class. No.: 621.3815310218
The boundary-scan handbook
LDR
:01330nam a2200313 a 4500
001
860740
003
DE-He213
005
20160720131937.0
006
m d
007
cr nn 008maaau
008
170720s2016 gw s 0 eng d
020
$a
9783319011745
$q
(electronic bk.)
020
$a
9783319011738
$q
(paper)
024
7
$a
10.1007/978-3-319-01174-5
$2
doi
035
$a
978-3-319-01174-5
040
$a
GP
$c
GP
041
0
$a
eng
050
4
$a
TK7868.P7
072
7
$a
TJFC
$2
bicssc
072
7
$a
TEC008010
$2
bisacsh
082
0 4
$a
621.3815310218
$2
23
090
$a
TK7868.P7
$b
P241 2016
100
1
$a
Parker, Kenneth P.
$3
1102627
245
1 4
$a
The boundary-scan handbook
$h
[electronic resource] /
$c
by Kenneth P. Parker.
250
$a
4th ed.
260
$a
Cham :
$c
2016.
$b
Springer International Publishing :
$b
Imprint: Springer,
300
$a
xxxiv, 552 p. :
$b
ill., digital ;
$c
24 cm.
505
0
$a
Boundary-Scan Basics And Vocabulary -- Boundary-Scan Description Language (BSDL) -- Boundary-Scan Testing -- Advanced Boundary-Scan Topics -- Design for Boundary-Scan Test -- Analog Measurement Basics -- IEEE 1149.4 Analog Boundary-Scan -- IEEE 1149.6 Testing Advanced I/O -- IEEE 1532:In-System Configuration -- IEEE 1149.8.1: Passive Components -- IEEE 1149.1:The 2013 Revision -- IEEE 1149.6: The 2015 Revision.
650
0
$a
Printed circuits
$x
Testing.
$3
1102628
650
0
$a
Printed circuits
$x
Testing
$x
Standards.
$3
1102629
650
0
$a
Boundary scan testing.
$3
1102630
650
0
$a
Electronic digital computers
$x
Circuits
$x
Design and construction.
$3
1102631
650
1 4
$a
Engineering.
$3
561152
650
2 4
$a
Circuits and Systems.
$3
670901
650
2 4
$a
Processor Architectures.
$3
669787
650
2 4
$a
Semiconductors.
$3
578843
710
2
$a
SpringerLink (Online service)
$3
593884
773
0
$t
Springer eBooks
856
4 0
$u
http://dx.doi.org/10.1007/978-3-319-01174-5
950
$a
Engineering (Springer-11647)
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