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CMOS RF circuit design for reliability and variability

Record Type:	Language materials, printed : Monograph/item
Title/Author:	CMOS RF circuit design for reliability and variability/ by Jiann-Shiun Yuan.
Author:	Yuan, Jiann-Shiun.
Published:	Singapore :Springer Singapore : : 2016.,
Description:	vi, 106 p. :ill., digital ; : 24 cm.;
Contained By:	Springer eBooks
Subject:	Radio frequency integrated circuits - Design and construction. -
Online resource:	http://dx.doi.org/10.1007/978-981-10-0884-9
ISBN:	9789811008849

CMOS RF circuit design for reliability and variability
Yuan, Jiann-Shiun.

CMOS RF circuit design for reliability and variability[electronic resource] /by Jiann-Shiun Yuan. - Singapore :Springer Singapore :2016. - vi, 106 p. :ill., digital ;24 cm. - SpringerBriefs in applied sciences and technology,2191-530X. - SpringerBriefs in applied sciences and technology..

CMOS Transistor Reliability and Variability -- Wireless Receiver and Transmitter Circuit Reliability -- Low Noise Amplifier Reliability and Variability -- Power Amplifier Reliability and Variability -- Voltage Controlled Oscillator Reliability and Variability -- Mixer Reliability.

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

ISBN: 9789811008849

Standard No.: 10.1007/978-981-10-0884-9doiSubjects--Topical Terms:

678923
Radio frequency integrated circuits
--Design and construction.

LC Class. No.: TK7874.78

Dewey Class. No.: 621.3815

CMOS RF circuit design for reliability and variability
LDR:02043nam a2200325 a 4500 001 863711
003 DE-He213
005 20161013171910.0
006 m d
007 cr nn 008maaau
008 170720s2016 si s 0 eng d
020 $a 9789811008849 $q (electronic bk.)
020 $a 9789811008825 $q (paper)
024 7 $a 10.1007/978-981-10-0884-9 $2 doi
035 $a 978-981-10-0884-9
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7874.78
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
082 0 4 $a 621.3815 $2 23
090 $a TK7874.78 $b .Y94 2016
100 1 $a Yuan, Jiann-Shiun. $3 1107925
245 1 0 $a CMOS RF circuit design for reliability and variability $h [electronic resource] / $c by Jiann-Shiun Yuan.
260 $a Singapore : $c 2016. $b Springer Singapore : $b Imprint: Springer,
300 $a vi, 106 p. : $b ill., digital ; $c 24 cm.
490 1 $a SpringerBriefs in applied sciences and technology, $x 2191-530X
505 0 $a CMOS Transistor Reliability and Variability -- Wireless Receiver and Transmitter Circuit Reliability -- Low Noise Amplifier Reliability and Variability -- Power Amplifier Reliability and Variability -- Voltage Controlled Oscillator Reliability and Variability -- Mixer Reliability.
520 $a The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.
650 0 $a Radio frequency integrated circuits $x Design and construction. $3 678923
650 0 $a Metal oxide semiconductors, Complementary $x Design and construction. $3 564465
650 1 4 $a Engineering. $3 561152
650 2 4 $a Circuits and Systems. $3 670901
650 2 4 $a Electronic Circuits and Devices. $3 782968
650 2 4 $a Microwaves, RF and Optical Engineering. $3 593918
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer eBooks
830 0 $a SpringerBriefs in applied sciences and technology. $3 885514
856 4 0 $u http://dx.doi.org/10.1007/978-981-10-0884-9
950 $a Engineering (Springer-11647)