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Defect sizing using non-destructive ...
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Defect sizing using non-destructive ultrasonic testing = applying bandwidth-dependent DAC and DGS curves /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Defect sizing using non-destructive ultrasonic testing/ by Wolf Kleinert.
其他題名:
applying bandwidth-dependent DAC and DGS curves /
作者:
Kleinert, Wolf.
出版者:
Cham :Springer International Publishing : : 2016.,
面頁冊數:
xviii, 118 p. :ill., digital ; : 24 cm.;
Contained By:
Springer eBooks
標題:
Ultrasonic testing. -
電子資源:
http://dx.doi.org/10.1007/978-3-319-32836-2
ISBN:
9783319328362
Defect sizing using non-destructive ultrasonic testing = applying bandwidth-dependent DAC and DGS curves /
Kleinert, Wolf.
Defect sizing using non-destructive ultrasonic testing
applying bandwidth-dependent DAC and DGS curves /[electronic resource] :by Wolf Kleinert. - Cham :Springer International Publishing :2016. - xviii, 118 p. :ill., digital ;24 cm.
Preface -- Sizing Methods: Distance Gain Size (DGS) and Distance Amplitude Correction (DAC) -- A new approach to bring DGS and DAC close together -- Diagrams -- Perspectives.
This book presents a precise approach for defect sizing using ultrasonics. It describes an alternative to the current European and American standards by neglecting their limitations. The approach presented here is not only valid for conventional angle beam probes, but also for phased array angle beam probes. It introduces an improved method which provides a significant productivity gain and calculates curves with high accuracy. Its content is of interest to all those working with distance gain size (DGS) methods or are using distance ampllitude correction (DAC) curves.
ISBN: 9783319328362
Standard No.: 10.1007/978-3-319-32836-2doiSubjects--Topical Terms:
761136
Ultrasonic testing.
LC Class. No.: TA417.4
Dewey Class. No.: 620.11274
Defect sizing using non-destructive ultrasonic testing = applying bandwidth-dependent DAC and DGS curves /
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