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X-ray and neutron techniques for nanomaterials characterization

Record Type:	Language materials, printed : Monograph/item
Title/Author:	X-ray and neutron techniques for nanomaterials characterization/ edited by Challa S. S. R. Kumar.
other author:	Kumar, Challa S. S. R.
Published:	Berlin, Heidelberg :Springer Berlin Heidelberg : : 2016.,
Description:	x, 830 p. :ill. (some col.), digital ; : 24 cm.;
Contained By:	Springer eBooks
Subject:	Nanostructured materials - Analysis. -
Online resource:	http://dx.doi.org/10.1007/978-3-662-48606-1
ISBN:	9783662486061

X-ray and neutron techniques for nanomaterials characterization
X-ray and neutron techniques for nanomaterials characterization[electronic resource] /edited by Challa S. S. R. Kumar. - Berlin, Heidelberg :Springer Berlin Heidelberg :2016. - x, 830 p. :ill. (some col.), digital ;24 cm.

Synchrotron X-ray phase nano-tomography for bone tissue characterization -- 3D chemical imaging of nanoscale biological, environmental, and synthetic materials by soft X-ray STXM spectro-tomography -- X-ray photon correlation spectroscopy for the characterization of soft and hard condensed matter -- XAFS for characterization of nanomaterials -- The characterization of atomically precise nano clusters using X-ray absorption spectroscopy -- X-ray absorption spectroscopic characterization of nanomaterial catalysts in electrochemistry and fuel cells -- In situ SXS and XAFS measurements of electrochemical interface -- Gas-phase near-edge X-ray absorption fine structure (NEXAFS) spectroscopy of nanoparticles, biopolymers, and ionic species -- In situ X-ray reciprocal space mapping for characterization of nanomaterials -- X-ray powder diffraction characterization of nanomaterials -- X-ray absorption fine structure analysis of catalytic nanomaterials -- Contribution of small angle X-ray and neutron scattering (SAXS & SANS) to the characterization of natural nano-materials -- Synchrotron small-angle X-ray scattering and small-angle neutron scattering studies of nanomaterials -- Quasi-elastic neutron scattering: An advanced technique for studying the relaxation processes in condensed matter.

Fifth volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about X-ray and Neutron Techniques for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

ISBN: 9783662486061

Standard No.: 10.1007/978-3-662-48606-1doiSubjects--Topical Terms:

783961
Nanostructured materials
--Analysis.

LC Class. No.: QC176.8.N35

Dewey Class. No.: 620.115

X-ray and neutron techniques for nanomaterials characterization
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520 $a Fifth volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about X-ray and Neutron Techniques for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
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