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Structural, syntactic, and statistical pattern recognition = Joint IAPR International Workshop, S+SSPR 2016, Merida, Mexico, November 29 - December 2, 2016 : proceedings /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Structural, syntactic, and statistical pattern recognition/ edited by Antonio Robles-Kelly ... [et al.].
Reminder of title:	Joint IAPR International Workshop, S+SSPR 2016, Merida, Mexico, November 29 - December 2, 2016 : proceedings /
remainder title:	S+SSPR 2016
other author:	Robles-Kelly, Antonio.
Published:	Cham :Springer International Publishing : : 2016.,
Description:	xiii, 588 p. :ill., digital ; : 24 cm.;
Contained By:	Springer eBooks
Subject:	Pattern recognition systems - Congresses. -
Online resource:	http://dx.doi.org/10.1007/978-3-319-49055-7
ISBN:	9783319490557

Structural, syntactic, and statistical pattern recognition = Joint IAPR International Workshop, S+SSPR 2016, Merida, Mexico, November 29 - December 2, 2016 : proceedings /
Structural, syntactic, and statistical pattern recognitionJoint IAPR International Workshop, S+SSPR 2016, Merida, Mexico, November 29 - December 2, 2016 : proceedings /[electronic resource] :S+SSPR 2016edited by Antonio Robles-Kelly ... [et al.]. - Cham :Springer International Publishing :2016. - xiii, 588 p. :ill., digital ;24 cm. - Lecture notes in computer science,100290302-9743 ;. - Lecture notes in computer science ;6140..

Dimensionality reduction -- Manifold learning and embedding methods -- Dissimilarity representations -- Graph-theoretic methods -- Model selection, classification and clustering -- Semi and fully supervised learning methods -- Shape analysis -- Spatio-temporal pattern recognition -- Structural matching -- Text and document analysis.

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis.

ISBN: 9783319490557

Standard No.: 10.1007/978-3-319-49055-7doiSubjects--Topical Terms:

568203
Pattern recognition systems
--Congresses.

LC Class. No.: TK7882.P3

Dewey Class. No.: 006.4

Structural, syntactic, and statistical pattern recognition = Joint IAPR International Workshop, S+SSPR 2016, Merida, Mexico, November 29 - December 2, 2016 : proceedings /
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