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X-rays and extreme ultraviolet radia...

Attwood, David T.

X-rays and extreme ultraviolet radiation : = principles and applications /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	X-rays and extreme ultraviolet radiation :/ David Attwood, Anne Sakdinawat ; illustrations by Linda Geniesse.
其他題名:	principles and applications /
作者:	Attwood, David T.
其他作者:	Sakdinawat, Anne.
出版者:	Cambridge, United Kingdom ;Cambridge University Press, : c2016.,
面頁冊數:	xix, 634 p. :ill. (some col.) ; : 26 cm.;
附註:	Earlier edition published under title: Soft x-rays and extreme ultraviolet radiation.
標題:	Grenz rays. -
電子資源:	https://www.loc.gov/catdir/enhancements/fy1618/2016035981-b.html
電子資源:	https://www.loc.gov/catdir/enhancements/fy1618/2016035981-d.html
電子資源:	https://www.loc.gov/catdir/enhancements/fy1618/2016035981-t.html
ISBN:	9781107062894 :

X-rays and extreme ultraviolet radiation : = principles and applications /
Attwood, David T.

X-rays and extreme ultraviolet radiation :principles and applications /David Attwood, Anne Sakdinawat ; illustrations by Linda Geniesse. - 2nd ed. - Cambridge, United Kingdom ;Cambridge University Press,c2016. - xix, 634 p. :ill. (some col.) ;26 cm.

Earlier edition published under title: Soft x-rays and extreme ultraviolet radiation.

Includes bibliographical references and index.

Radiation and scattering at EUV and x-ray wavelengths -- Wave propagation and refractive index at x-ray and EUV wavelengths -- Coherence at short wavelengths -- Synchrotron radiation -- X-ray and EUV free electron lasers -- Laser high harmonic generation -- Physics of hot dense plasmas -- Extreme ultraviolet and soft x-ray lasers -- X-ray and extreme ultraviolet optics -- X-ray and EUV imaging.

"There has been a remarkable improvement in capabilities for probing matter with x-rays and extreme ultraviolet (EUV) radiation since the previous edition of this book appeared in 2000. The spectral brightness and coherence of available research facilities has increased by many orders of magnitude across the EUV and x-ray spectral regions, extending from photon energies of 30 eV (40 nm wavelength) to 50 keV (0.25 Å). The ability to probe electron dynamics in atoms, molecules, clusters and solids has been extended from picoseconds to femtoseconds and attoseconds. X-ray optics have improved dramatically, with reflective and diffractive optics now able to focus, or resolve images, to 10nm across much of this spectrum. New techniques have emerged for attosecond temporal measurements, nanoscale tomographic imaging of individual cells, and ever more sophisticated coherent diffraction and imaging techniques. Commercial capabilities have also improved with brighter laboratory sources and widely available x-ray microscopes for nanoscale imaging in the research and commercial sectors. And it appears that high volume manufacturing of computer chips with 13.5 nm EUV radiation will soon become a reality, likely reaching world markets at the 7 nm node in 2017"--

ISBN: 9781107062894 :NT2102

LCCN: 2016035981Subjects--Topical Terms:

1129961
Grenz rays.

LC Class. No.: QC482.G68 / A886 2016

Dewey Class. No.: 539.7/222

X-rays and extreme ultraviolet radiation : = principles and applications /
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504 $a Includes bibliographical references and index.
505 0 # $a Radiation and scattering at EUV and x-ray wavelengths -- Wave propagation and refractive index at x-ray and EUV wavelengths -- Coherence at short wavelengths -- Synchrotron radiation -- X-ray and EUV free electron lasers -- Laser high harmonic generation -- Physics of hot dense plasmas -- Extreme ultraviolet and soft x-ray lasers -- X-ray and extreme ultraviolet optics -- X-ray and EUV imaging.
520 # $a "There has been a remarkable improvement in capabilities for probing matter with x-rays and extreme ultraviolet (EUV) radiation since the previous edition of this book appeared in 2000. The spectral brightness and coherence of available research facilities has increased by many orders of magnitude across the EUV and x-ray spectral regions, extending from photon energies of 30 eV (40 nm wavelength) to 50 keV (0.25 Å). The ability to probe electron dynamics in atoms, molecules, clusters and solids has been extended from picoseconds to femtoseconds and attoseconds. X-ray optics have improved dramatically, with reflective and diffractive optics now able to focus, or resolve images, to 10nm across much of this spectrum. New techniques have emerged for attosecond temporal measurements, nanoscale tomographic imaging of individual cells, and ever more sophisticated coherent diffraction and imaging techniques. Commercial capabilities have also improved with brighter laboratory sources and widely available x-ray microscopes for nanoscale imaging in the research and commercial sectors. And it appears that high volume manufacturing of computer chips with 13.5 nm EUV radiation will soon become a reality, likely reaching world markets at the 7 nm node in 2017"-- $c Provided by publisher.
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856 4 2 $3 Contributor biographical information $u https://www.loc.gov/catdir/enhancements/fy1618/2016035981-b.html
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856 4 1 $3 Table of contents only $u https://www.loc.gov/catdir/enhancements/fy1618/2016035981-t.html