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Semiconductor devices in harsh condi...
~
Weide-Zaage, Kirsten.
Semiconductor devices in harsh conditions /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Semiconductor devices in harsh conditions // edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske ; managing editor, Krzysztof Iniewski.
其他作者:
Chrzanowska-Jeske, Malgorzata.
出版者:
Boca Raton, FL :CRC Press, Taylor & Francis Group, : c2017.,
面頁冊數:
xxii, 234 p. :ill. ; : 24 cm.;
標題:
Environmental testing. -
ISBN:
9781498743808 (cloth) :
Semiconductor devices in harsh conditions /
Semiconductor devices in harsh conditions /
edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske ; managing editor, Krzysztof Iniewski. - Boca Raton, FL :CRC Press, Taylor & Francis Group,c2017. - xxii, 234 p. :ill. ;24 cm. - Devices, circuits, and systems series.
Includes bibliographical references and index.
ISBN: 9781498743808 (cloth) :NT3329
LCCN: 2016022751Subjects--Topical Terms:
772167
Environmental testing.
LC Class. No.: TK7871.85 / .S449 2017
Dewey Class. No.: 621.3815/2
Semiconductor devices in harsh conditions /
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