國立虎尾科技大學 |

A Simplified Phase Display System for 3D Surface Measurement and Abnormal Surface Pattern Detection.

紀錄類型:	書目-語言資料,手稿 : Monograph/item
正題名/作者:	A Simplified Phase Display System for 3D Surface Measurement and Abnormal Surface Pattern Detection./
作者:	Weng, Xin.
面頁冊數:	1 online resource (156 pages)
附註:	Source: Dissertation Abstracts International, Volume: 78-11(E), Section: B.
Contained By:	Dissertation Abstracts International78-11B(E).
標題:	Mechanical engineering. -
電子資源:	click for full text (PQDT)
ISBN:	9781369903492

A Simplified Phase Display System for 3D Surface Measurement and Abnormal Surface Pattern Detection.
Weng, Xin.

A Simplified Phase Display System for 3D Surface Measurement and Abnormal Surface Pattern Detection. - 1 online resource (156 pages)

Source: Dissertation Abstracts International, Volume: 78-11(E), Section: B.

Thesis (Ph.D.)

Includes bibliographical references

Today's engineering products demand increasingly strict tolerances. The shape of a machined surface plays a critical role to the desired functionality of a product. Even a small error can be the difference between a successful product launch and a major delay. It is important to develop tools that confirm the quality and accuracy of manufactured products. The key to assessing the quality is robust measurement and inspection tools combined with advanced analysis. This research is motivated by the goals of 1) developing an advanced optical metrology system that provides accurate 3D profiles of target objects with curvature and irregular texture and 2) developing algorithms that can recognize and extract meaningful surface features with the consideration of machining process information.

Electronic reproduction.
Ann Arbor, Mich. :
ProQuest,
2018

Mode of access: World Wide Web

ISBN: 9781369903492Subjects--Topical Terms:

557493
Mechanical engineering.
Index Terms--Genre/Form:

554714
Electronic books.

A Simplified Phase Display System for 3D Surface Measurement and Abnormal Surface Pattern Detection.
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100 1 $a Weng, Xin. $3 1182274
245 1 2 $a A Simplified Phase Display System for 3D Surface Measurement and Abnormal Surface Pattern Detection.
264 0 $c 2017
300 $a 1 online resource (156 pages)
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
500 $a Source: Dissertation Abstracts International, Volume: 78-11(E), Section: B.
500 $a Adviser: Jun Ni.
502 $a Thesis (Ph.D.) $c University of Michigan $d 2017.
504 $a Includes bibliographical references
520 $a Today's engineering products demand increasingly strict tolerances. The shape of a machined surface plays a critical role to the desired functionality of a product. Even a small error can be the difference between a successful product launch and a major delay. It is important to develop tools that confirm the quality and accuracy of manufactured products. The key to assessing the quality is robust measurement and inspection tools combined with advanced analysis. This research is motivated by the goals of 1) developing an advanced optical metrology system that provides accurate 3D profiles of target objects with curvature and irregular texture and 2) developing algorithms that can recognize and extract meaningful surface features with the consideration of machining process information.
520 $a A new low cost measurement system with a simple coherent interferometric fringe projection system is developed. Comparing with existing optical measurement systems, the developed system generates fringe patterns on object surface through a pair of fiber optics that have a relatively simple and flexible configuration. Three-dimensional measurements of a variety of surfaces with curvatures demonstrate the applicability and flexibility of the developed system. An improved phase unwrapping algorithm based on a flood fill method is developed to enhance the performance of image processing. The developed algorithm performs phase unwrapping under the guidance of a hybrid quality map that is generated by considering the quality of both acquired original intensity images and the calculated wrapped phase map.
520 $a Advances in metrology systems enable engineers to obtain a large amount of surface information. A systematic framework for surface shape characterization and abnormal pattern detection is proposed to take the advantage of the availability of high definition surface measurements through advanced metrology systems. The proposed framework evaluates a measured surface in two stages. The first step focuses on the extraction of general shape (e.g., surface form) from measurement for surface functionality evaluation and process monitoring. The second step focuses on the extraction of application specific surface details with the consideration of process information (e.g., surface waviness). Applications of automatic abnormal surface pattern detection have been demonstrated.
520 $a In summary, this research focuses on two core areas: 1) developing metrology system that is capable of measuring engineered surfaces accurately; 2) proposing a methodology that can extract meaningful information from high definition measurements with consideration of process information and product functionality.
533 $a Electronic reproduction. $b Ann Arbor, Mich. : $c ProQuest, $d 2018
538 $a Mode of access: World Wide Web
650 4 $a Mechanical engineering. $3 557493
655 7 $a Electronic books. $2 local $3 554714
690 $a 0548
710 2 $a ProQuest Information and Learning Co. $3 1178819
710 2 $a University of Michigan. $b Mechanical Engineering. $3 1178961
773 0 $t Dissertation Abstracts International $g 78-11B(E).
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=10612216 $z click for full text (PQDT)