國立虎尾科技大學 |

Power, Thermal, Reliability and Variability Management of Mobile Devices.

紀錄類型:	書目-語言資料,手稿 : Monograph/item
正題名/作者:	Power, Thermal, Reliability and Variability Management of Mobile Devices./
作者:	Mercati, Pietro.
面頁冊數:	1 online resource (172 pages)
附註:	Source: Dissertation Abstracts International, Volume: 78-08(E), Section: B.
Contained By:	Dissertation Abstracts International78-08B(E).
標題:	Computer science. -
電子資源:	click for full text (PQDT)
ISBN:	9781369681963

Power, Thermal, Reliability and Variability Management of Mobile Devices.
Mercati, Pietro.

Power, Thermal, Reliability and Variability Management of Mobile Devices. - 1 online resource (172 pages)

Source: Dissertation Abstracts International, Volume: 78-08(E), Section: B.

Thesis (Ph.D.)

Includes bibliographical references

Today, there are more mobile devices than human beings on the planet. Mobiles execute a wide variety of applications and are expected to perform in many different environments, from the deserts to the mountain tops. Their goal is to meet user's expectations and deliver high quality of experience. Unfortunately, to achieve this they face a set of interrelated problems. The heterogeneous components that execute varied tasks can drain a battery in a matter of hours. Power dissipation raises the device temperature, which can be a source of discomfort for the user. Temperature stress also dramatically increases the impact of reliability degradation mechanisms on transistors and interconnects, which can lead to early failure. These problems only worsen with CMOS scaling, which reduces the accuracy of the fabrication process and increases the variability in power, performance and degradation rate. Dynamic management mitigates such issuesby adapting the operating conditions at runtime. Strategies have been very well studied for traditional systems like desktops and servers, but unfortunately they cannot be applied to mobiles, because they do not consider user experience. Existing dynamic management for mobiles only begins to target the problems of power and thermal management, and offers limited solutions for reliability and variability management. This is fundamental to guarantee power savings and prevent early failure in a scenario of increasing variability.

Electronic reproduction.
Ann Arbor, Mich. :
ProQuest,
2018

Mode of access: World Wide Web

ISBN: 9781369681963Subjects--Topical Terms:

573171
Computer science.
Index Terms--Genre/Form:

554714
Electronic books.

Power, Thermal, Reliability and Variability Management of Mobile Devices.
LDR:04063ntm a2200361Ki 4500 001 911173
005 20180529081858.5
006 m o u
007 cr mn||||a|a||
008 190606s2017 xx obm 000 0 eng d
020 $a 9781369681963
035 $a (MiAaPQ)AAI10242365
035 $a (MiAaPQ)ucsd:16138
035 $a AAI10242365
040 $a MiAaPQ $b eng $c MiAaPQ
099 $a TUL $f hyy $c available through World Wide Web
100 1 $a Mercati, Pietro. $3 1182847
245 1 0 $a Power, Thermal, Reliability and Variability Management of Mobile Devices.
264 0 $c 2017
300 $a 1 online resource (172 pages)
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
500 $a Source: Dissertation Abstracts International, Volume: 78-08(E), Section: B.
500 $a Adviser: Tajana S. Rosing.
502 $a Thesis (Ph.D.) $c University of California, San Diego $d 2017.
504 $a Includes bibliographical references
520 $a Today, there are more mobile devices than human beings on the planet. Mobiles execute a wide variety of applications and are expected to perform in many different environments, from the deserts to the mountain tops. Their goal is to meet user's expectations and deliver high quality of experience. Unfortunately, to achieve this they face a set of interrelated problems. The heterogeneous components that execute varied tasks can drain a battery in a matter of hours. Power dissipation raises the device temperature, which can be a source of discomfort for the user. Temperature stress also dramatically increases the impact of reliability degradation mechanisms on transistors and interconnects, which can lead to early failure. These problems only worsen with CMOS scaling, which reduces the accuracy of the fabrication process and increases the variability in power, performance and degradation rate. Dynamic management mitigates such issuesby adapting the operating conditions at runtime. Strategies have been very well studied for traditional systems like desktops and servers, but unfortunately they cannot be applied to mobiles, because they do not consider user experience. Existing dynamic management for mobiles only begins to target the problems of power and thermal management, and offers limited solutions for reliability and variability management. This is fundamental to guarantee power savings and prevent early failure in a scenario of increasing variability.
520 $a In this dissertation, we propose the design and real implementation of a novel unified framework for the comprehensive dynamic management of power, temperature, reliability and variability in mobile systems, subject to user experience requirements. We develop novel lightweight solutions for power and thermal management that optimize for both application behavior and battery lifetime. We complement this with our framework for the online emulation of reliability degradation and variability, which enables the development and rapid prototyping of hardware management solutions. We leverage our emulation framework to design and integrate dynamic reliability and variability management for mobile systems. The presented solutions have been implemented and tested on real devices. Our strategy can meet user experience requirements with a selected target battery lifetime extension of at least 25%. Also, it achieves up to 35% savings in power consumption at the device level, with up to 1 year reliability lifetime improvement for a multicore platform and up to 100% of performance improvement on cluster architectures. Finally, on devices affected by variability it achieves up to 160% performance improvement over the state-of-the-art while meeting the lifetime constraints.
533 $a Electronic reproduction. $b Ann Arbor, Mich. : $c ProQuest, $d 2018
538 $a Mode of access: World Wide Web
650 4 $a Computer science. $3 573171
650 4 $a Electrical engineering. $3 596380
655 7 $a Electronic books. $2 local $3 554714
690 $a 0984
690 $a 0544
710 2 $a ProQuest Information and Learning Co. $3 1178819
710 2 $a University of California, San Diego. $b Computer Science. $3 1182161
773 0 $t Dissertation Abstracts International $g 78-08B(E).
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=10242365 $z click for full text (PQDT)