國立虎尾科技大學 |

登入

回首頁

Spectrum Analyzer Based Phase Measur...

Marathe, Shubhankar.

Spectrum Analyzer Based Phase Measurement for EMI Scanning Applications.

紀錄類型:	書目-語言資料,手稿 : Monograph/item
正題名/作者:	Spectrum Analyzer Based Phase Measurement for EMI Scanning Applications./
作者:	Marathe, Shubhankar.
面頁冊數:	1 online resource (60 pages)
附註:	Source: Masters Abstracts International, Volume: 56-05.
Contained By:	Masters Abstracts International56-05(E).
標題:	Electrical engineering. -
電子資源:	click for full text (PQDT)
ISBN:	9780355087611

Spectrum Analyzer Based Phase Measurement for EMI Scanning Applications.
Marathe, Shubhankar.

Spectrum Analyzer Based Phase Measurement for EMI Scanning Applications. - 1 online resource (60 pages)

Source: Masters Abstracts International, Volume: 56-05.

Thesis (M.S.)--Missouri University of Science and Technology, 2017.

Includes bibliographical references

Often Electromagnetic Interference (EMI) scanning applications require phase and magnitude information for the creation of equivalent radiation models and for far-field predictions. Magnitude information can be obtained using a spectrum analyzer (SA), which is relatively inexpensive compared to phase resolving instruments such as oscilloscopes (scope) and vector network analyzers (VNA). The study focusses on the development of a near-field scanning method using a SA to measure the phase of the device under test (DUT) signals.

Electronic reproduction.
Ann Arbor, Mich. :
ProQuest,
2018

Mode of access: World Wide Web

ISBN: 9780355087611Subjects--Topical Terms:

596380
Electrical engineering.
Index Terms--Genre/Form:

554714
Electronic books.

Spectrum Analyzer Based Phase Measurement for EMI Scanning Applications.
LDR:02455ntm a2200349Ki 4500 001 920604
005 20181203094030.5
006 m o u
007 cr mn||||a|a||
008 190606s2017 xx obm 000 0 eng d
020 $a 9780355087611
035 $a (MiAaPQ)AAI10252644
035 $a (MiAaPQ)missouriscitech:10917
035 $a AAI10252644
040 $a MiAaPQ $b eng $c MiAaPQ $d NTU
100 1 $a Marathe, Shubhankar. $3 1195455
245 1 0 $a Spectrum Analyzer Based Phase Measurement for EMI Scanning Applications.
264 0 $c 2017
300 $a 1 online resource (60 pages)
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
500 $a Source: Masters Abstracts International, Volume: 56-05.
500 $a Adviser: David Pommerenke.
502 $a Thesis (M.S.)--Missouri University of Science and Technology, 2017.
504 $a Includes bibliographical references
520 $a Often Electromagnetic Interference (EMI) scanning applications require phase and magnitude information for the creation of equivalent radiation models and for far-field predictions. Magnitude information can be obtained using a spectrum analyzer (SA), which is relatively inexpensive compared to phase resolving instruments such as oscilloscopes (scope) and vector network analyzers (VNA). The study focusses on the development of a near-field scanning method using a SA to measure the phase of the device under test (DUT) signals.
520 $a The first part deals with the development of the method in software simulation tools and testing it under standard test conditions. The second part deals with the assembly of the measurement components---phase shifting cables, switches, attenuators and combiners. The measurement method is demonstrated by measuring the phase of the known signal. In the third part the measurement method is tested on a DUT having near field radiating sources. The measurements are performed and compared to the existing methods. This study introduces and optimizes SA based phase measurements and compares the results to oscilloscope and VNA based methods for sine waves and real EMI signals.
533 $a Electronic reproduction. $b Ann Arbor, Mich. : $c ProQuest, $d 2018
538 $a Mode of access: World Wide Web
650 4 $a Electrical engineering. $3 596380
650 4 $a Engineering. $3 561152
655 7 $a Electronic books. $2 local $3 554714
690 $a 0544
690 $a 0537
710 2 $a ProQuest Information and Learning Co. $3 1178819
710 2 $a Missouri University of Science and Technology. $b Electrical Engineering. $3 1182390
773 0 $t Masters Abstracts International $g 56-05(E).
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=10252644 $z click for full text (PQDT)

筆 0 讀者評論

多媒體

評論

新增評論分享你的心得

Export

取書館別