國立虎尾科技大學 |

VLSI design and test = 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017 : revised selected papers /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	VLSI design and test/ edited by Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh.
其他題名:	21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017 : revised selected papers /
其他題名:	VDAT 2017
其他作者:	Kaushik, Brajesh Kumar.
團體作者:	Workshop on the Preservation of Stability under Discretization
出版者:	Singapore :Springer Singapore : : 2017.,
面頁冊數:	xxi, 815 p. :ill., digital ; : 24 cm.;
Contained By:	Springer eBooks
標題:	Integrated circuits - Congresses. - Very large scale integration -
電子資源:	http://dx.doi.org/10.1007/978-981-10-7470-7
ISBN:	9789811074707

VLSI design and test = 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017 : revised selected papers /
VLSI design and test21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017 : revised selected papers /[electronic resource] :VDAT 2017edited by Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh. - Singapore :Springer Singapore :2017. - xxi, 815 p. :ill., digital ;24 cm. - Communications in computer and information science,7111865-0929 ;. - Communications in computer and information science ;311..

Digital design -- Analog/mixed signal -- VLSI testing -- Devices and technology -- VLSI architectures -- Emerging technologies and memory -- System design -- Low power design and test -- RF circuits -- Architecture and CAD -- Design verification.

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

ISBN: 9789811074707

Standard No.: 10.1007/978-981-10-7470-7doiSubjects--Topical Terms:

884630
Integrated circuits
--Very large scale integration--Congresses.

LC Class. No.: TK7874.75

Dewey Class. No.: 621.395

VLSI design and test = 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017 : revised selected papers /
LDR:01976nam a2200337 a 4500 001 922370
003 DE-He213
005 20171221002030.0
006 m d
007 cr nn 008maaau
008 190624s2017 si s 0 eng d
020 $a 9789811074707 $q (electronic bk.)
020 $a 9789811074691 $q (paper)
024 7 $a 10.1007/978-981-10-7470-7 $2 doi
035 $a 978-981-10-7470-7
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7874.75
072 7 $a UK $2 bicssc
072 7 $a COM067000 $2 bisacsh
082 0 4 $a 621.395 $2 23
090 $a TK7874.75 $b .V393 2017
111 2 $a Workshop on the Preservation of Stability under Discretization $d (2001 : $c Fort Collins, Colo.) $3 527686
245 1 0 $a VLSI design and test $h [electronic resource] : $b 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017 : revised selected papers / $c edited by Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh.
246 3 $a VDAT 2017
260 $a Singapore : $c 2017. $b Springer Singapore : $b Imprint: Springer,
300 $a xxi, 815 p. : $b ill., digital ; $c 24 cm.
490 1 $a Communications in computer and information science, $x 1865-0929 ; $v 711
505 0 $a Digital design -- Analog/mixed signal -- VLSI testing -- Devices and technology -- VLSI architectures -- Emerging technologies and memory -- System design -- Low power design and test -- RF circuits -- Architecture and CAD -- Design verification.
520 $a This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
650 0 $a Integrated circuits $x Very large scale integration $x Testing $v Congresses. $3 884630
650 0 $a Integrated circuits $x Very large scale integration $x Design and construction $v Textbooks. $3 681124 $3 733636
650 1 4 $a Computer Science. $3 593922
650 2 4 $a Computer Hardware. $3 669779
650 2 4 $a Processor Architectures. $3 669787
650 2 4 $a Computer Communication Networks. $3 669310
700 1 $a Kaushik, Brajesh Kumar. $3 783480
700 1 $a Dasgupta, Sudeb. $3 1129875
700 1 $a Singh, Virendra. $3 1197901
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer eBooks
830 0 $a Communications in computer and information science ; $v 311. $3 881211
856 4 0 $u http://dx.doi.org/10.1007/978-981-10-7470-7
950 $a Computer Science (Springer-11645)