國立虎尾科技大學 |

Using imperfect semiconductor systems for unique identification

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Using imperfect semiconductor systems for unique identification/ by Jonathan Roberts.
作者:	Roberts, Jonathan.
出版者:	Cham :Springer International Publishing : : 2017.,
面頁冊數:	xv, 123 p. :ill., digital ; : 24 cm.;
Contained By:	Springer eBooks
標題:	Semiconductors. -
電子資源:	http://dx.doi.org/10.1007/978-3-319-67891-7
ISBN:	9783319678917

Using imperfect semiconductor systems for unique identification
Roberts, Jonathan.

Using imperfect semiconductor systems for unique identification[electronic resource] /by Jonathan Roberts. - Cham :Springer International Publishing :2017. - xv, 123 p. :ill., digital ;24 cm. - Springer theses,2190-5053. - Springer theses..

An Introduction to Security Based on Physical Disorder -- An Introduction to Semiconductors and Quantum Confinement -- Sample Preparation and Experimental Techniques -- Unique Identification with Resonant Tunneling Diodes -- Langmuir-Blodgett Deposition of 2D Materials for Unique Identification -- Building Optoelectronic Heterostructures with the Langmuir-Blodgett Technique -- Conclusions and Future Work.

This thesis describes novel devices for the secure identification of objects or electronic systems. The identification relies on the the atomic-scale uniqueness of semiconductor devices by measuring a macroscopic quantum property of the system in question. Traditionally, objects and electronic systems have been securely identified by measuring specific characteristics: common examples include passwords, fingerprints used to identify a person or an electronic device, and holograms that can tag a given object to prove its authenticity. Unfortunately, modern technologies also make it possible to circumvent these everyday techniques. Variations in quantum properties are amplified by the existence of atomic-scale imperfections. As such, these devices are the hardest possible systems to clone. They also use the least resources and provide robust security. Hence they have tremendous potential significance as a means of reliably telling the good guys from the bad.

ISBN: 9783319678917

Standard No.: 10.1007/978-3-319-67891-7doiSubjects--Topical Terms:

578843
Semiconductors.

LC Class. No.: QA402 / .R634 2017

Dewey Class. No.: 530

Using imperfect semiconductor systems for unique identification
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505 0 $a An Introduction to Security Based on Physical Disorder -- An Introduction to Semiconductors and Quantum Confinement -- Sample Preparation and Experimental Techniques -- Unique Identification with Resonant Tunneling Diodes -- Langmuir-Blodgett Deposition of 2D Materials for Unique Identification -- Building Optoelectronic Heterostructures with the Langmuir-Blodgett Technique -- Conclusions and Future Work.
520 $a This thesis describes novel devices for the secure identification of objects or electronic systems. The identification relies on the the atomic-scale uniqueness of semiconductor devices by measuring a macroscopic quantum property of the system in question. Traditionally, objects and electronic systems have been securely identified by measuring specific characteristics: common examples include passwords, fingerprints used to identify a person or an electronic device, and holograms that can tag a given object to prove its authenticity. Unfortunately, modern technologies also make it possible to circumvent these everyday techniques. Variations in quantum properties are amplified by the existence of atomic-scale imperfections. As such, these devices are the hardest possible systems to clone. They also use the least resources and provide robust security. Hence they have tremendous potential significance as a means of reliably telling the good guys from the bad.
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