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Accurate and robust spectral testing with relaxed instrumentation requirements

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Accurate and robust spectral testing with relaxed instrumentation requirements/ by Yuming Zhuang, Degang Chen.
Author:	Zhuang, Yuming.
other author:	Chen, Degang.
Published:	Cham :Springer International Publishing : : 2018.,
Description:	xiv, 170 p. :ill., digital ; : 24 cm.;
Contained By:	Springer eBooks
Subject:	Measuring instruments - Testing. -
Online resource:	http://dx.doi.org/10.1007/978-3-319-77718-4
ISBN:	9783319777184

Accurate and robust spectral testing with relaxed instrumentation requirements
Zhuang, Yuming.

Accurate and robust spectral testing with relaxed instrumentation requirements[electronic resource] /by Yuming Zhuang, Degang Chen. - Cham :Springer International Publishing :2018. - xiv, 170 p. :ill., digital ;24 cm.

Chapter 1. Introduction -- Chapter 2.Algorithms for accurate spectral analysis in the presence of arbitrary non-coherency and large distortion -- Chapter 3.Accurate spectral testing with arbitrary non- coherency in sampling and simultaneous drifts in amplitude and frequency -- Chapter 4.High-purity sine wave generation using nonlinear DAC with pre-distortion based on low-cost accurate DAC-ADC co-testing -- Chapter 5.Low cost ultra-pure sine wave generation with self-calibration -- Chapter 6.Accurate spectral testing with non-coherent sampling for multi-tone test -- Chapter 7.Accurate spectral testing with impure test stimulus for multi-tone test -- Chapter 8.Multi-tone sine wave generation achieving the theoretical minimum of peak-to-average power ratio -- Chapter 9.Accurate linearity testing using low purity stimulus robust against flicker noise -- Chapter 10.Summary.

This book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to improve. Test engineers will be enabled to accurately set their devices & systems at much simpler test setup, much reduced complexity and much lower cost.

ISBN: 9783319777184

Standard No.: 10.1007/978-3-319-77718-4doiSubjects--Topical Terms:

1202321
Measuring instruments
--Testing.

LC Class. No.: TK7868.D5

Dewey Class. No.: 621.38223

Accurate and robust spectral testing with relaxed instrumentation requirements
LDR:02274nam a2200313 a 4500 001 924942
003 DE-He213
005 20180927150044.0
006 m d
007 cr nn 008maaau
008 190625s2018 gw s 0 eng d
020 $a 9783319777184 $q (electronic bk.)
020 $a 9783319777177 $q (paper)
024 7 $a 10.1007/978-3-319-77718-4 $2 doi
035 $a 978-3-319-77718-4
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7868.D5
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
082 0 4 $a 621.38223 $2 23
090 $a TK7868.D5 $b Z63 2018
100 1 $a Zhuang, Yuming. $3 1202319
245 1 0 $a Accurate and robust spectral testing with relaxed instrumentation requirements $h [electronic resource] / $c by Yuming Zhuang, Degang Chen.
260 $a Cham : $c 2018. $b Springer International Publishing : $b Imprint: Springer,
300 $a xiv, 170 p. : $b ill., digital ; $c 24 cm.
505 0 $a Chapter 1. Introduction -- Chapter 2.Algorithms for accurate spectral analysis in the presence of arbitrary non-coherency and large distortion -- Chapter 3.Accurate spectral testing with arbitrary non- coherency in sampling and simultaneous drifts in amplitude and frequency -- Chapter 4.High-purity sine wave generation using nonlinear DAC with pre-distortion based on low-cost accurate DAC-ADC co-testing -- Chapter 5.Low cost ultra-pure sine wave generation with self-calibration -- Chapter 6.Accurate spectral testing with non-coherent sampling for multi-tone test -- Chapter 7.Accurate spectral testing with impure test stimulus for multi-tone test -- Chapter 8.Multi-tone sine wave generation achieving the theoretical minimum of peak-to-average power ratio -- Chapter 9.Accurate linearity testing using low purity stimulus robust against flicker noise -- Chapter 10.Summary.
520 $a This book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to improve. Test engineers will be enabled to accurately set their devices & systems at much simpler test setup, much reduced complexity and much lower cost.
650 0 $a Measuring instruments $x Testing. $3 1202321
650 0 $a Signal theory (Telecommunication) $3 632492
650 1 4 $a Engineering. $3 561152
650 2 4 $a Circuits and Systems. $3 670901
650 2 4 $a Electronic Circuits and Devices. $3 782968
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 670219
700 1 $a Chen, Degang. $3 1202320
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer eBooks
856 4 0 $u http://dx.doi.org/10.1007/978-3-319-77718-4
950 $a Engineering (Springer-11647)