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Ellipsometry of functional organic s...
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Hinrichs, Karsten.
Ellipsometry of functional organic surfaces and films
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Ellipsometry of functional organic surfaces and films/ edited by Karsten Hinrichs, Klaus-Jochen Eichhorn.
other author:
Hinrichs, Karsten.
Published:
Cham :Springer International Publishing : : 2018.,
Description:
xxvi, 547 p. :digital ; : 24 cm.;
Contained By:
Springer eBooks
Subject:
Ellipsometry. -
Online resource:
http://dx.doi.org/10.1007/978-3-319-75895-4
ISBN:
9783319758954
Ellipsometry of functional organic surfaces and films
Ellipsometry of functional organic surfaces and films
[electronic resource] /edited by Karsten Hinrichs, Klaus-Jochen Eichhorn. - 2nd ed. - Cham :Springer International Publishing :2018. - xxvi, 547 p. :digital ;24 cm. - Springer series in surface sciences,v.520931-5195 ;. - Springer series in surface sciences ;48..
Indtroduction -- Ellipsometry: A survey of Concept -- Biomolecules at surfaces -- Smart polymer surfaces and films -- Nanostructured surfaces and organic/inorganic hybrids -- Thin films of organic semiconductors for OPV, OLEDs and OTFT -- Developments in ellipsometric real-time/in-situ monitoring techniques -- Infrared spectroscopic methods for characterization of thin organic films -- Brillant infrared light sources for micro-ellipsometric studies of organic films -- Optical constants.
This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years. The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.
ISBN: 9783319758954
Standard No.: 10.1007/978-3-319-75895-4doiSubjects--Topical Terms:
904832
Ellipsometry.
LC Class. No.: QC443 / .E455 2018
Dewey Class. No.: 535.52
Ellipsometry of functional organic surfaces and films
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edited by Karsten Hinrichs, Klaus-Jochen Eichhorn.
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Indtroduction -- Ellipsometry: A survey of Concept -- Biomolecules at surfaces -- Smart polymer surfaces and films -- Nanostructured surfaces and organic/inorganic hybrids -- Thin films of organic semiconductors for OPV, OLEDs and OTFT -- Developments in ellipsometric real-time/in-situ monitoring techniques -- Infrared spectroscopic methods for characterization of thin organic films -- Brillant infrared light sources for micro-ellipsometric studies of organic films -- Optical constants.
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This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years. The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.
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Ellipsometry.
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Surface and Interface Science, Thin Films.
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Surfaces and Interfaces, Thin Films.
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Hinrichs, Karsten.
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Eichhorn, Klaus-Jochen.
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http://dx.doi.org/10.1007/978-3-319-75895-4
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Physics and Astronomy (Springer-11651)
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