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Progress in nanoscale characterization and manipulation

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Progress in nanoscale characterization and manipulation/ edited by Rongming Wang ... [et al.].
其他作者:	Wang, Rongming.
出版者:	Singapore :Springer Singapore : : 2018.,
面頁冊數:	vii, 508 p. :ill. (some col.), digital ; : 24 cm.;
Contained By:	Springer eBooks
標題:	Electron microscopy. -
電子資源:	https://doi.org/10.1007/978-981-13-0454-5
ISBN:	9789811304545

Progress in nanoscale characterization and manipulation
Progress in nanoscale characterization and manipulation[electronic resource] /edited by Rongming Wang ... [et al.]. - Singapore :Springer Singapore :2018. - vii, 508 p. :ill. (some col.), digital ;24 cm. - Springer tracts in modern physics,v.2720081-3869 ;. - Springer tracts in modern physics ;v.248..

Electron/Ion Optics -- Scanning Electron Microscopy -- Transmission Electron Microscopy -- Scanning Transmission Electron Microscopy (STEM) -- Spectroscopy -- Aberration Corrected Transmission Electron Microscopy and Its Applications -- In situ TEM: Theory and Applications -- Helium Ion Microscopy.

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.

ISBN: 9789811304545

Standard No.: 10.1007/978-981-13-0454-5doiSubjects--Topical Terms:

673459
Electron microscopy.

LC Class. No.: QH212.E4 / P764 2018

Dewey Class. No.: 502.825

Progress in nanoscale characterization and manipulation
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520 $a This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
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