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Lock-in thermography = basics and use for evaluating electronic devices and materials /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Lock-in thermography/ by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert.
其他題名:	basics and use for evaluating electronic devices and materials /
作者:	Breitenstein, Otwin.
其他作者:	Warta, Wilhelm.
出版者:	Cham :Springer International Publishing : : 2018.,
面頁冊數:	xxi, 321 p. :ill. (some color), digital ; : 24 cm.;
Contained By:	Springer eBooks
標題:	Electronic apparatus and appliances - Thermal properties. -
電子資源:	https://doi.org/10.1007/978-3-319-99825-1
ISBN:	9783319998251

Lock-in thermography = basics and use for evaluating electronic devices and materials /
Breitenstein, Otwin.

Lock-in thermographybasics and use for evaluating electronic devices and materials /[electronic resource] :by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert. - 3rd ed. - Cham :Springer International Publishing :2018. - xxi, 321 p. :ill. (some color), digital ;24 cm. - Springer series in advanced microelectronics,v.101437-0387 ;. - Springer series in advanced microelectronics ;33..

Introduction -- Physical and Technical Basics -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook.

This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.

ISBN: 9783319998251

Standard No.: 10.1007/978-3-319-99825-1doiSubjects--Topical Terms:

772291
Electronic apparatus and appliances
--Thermal properties.

LC Class. No.: TK7870.25 / .B745 2018

Dewey Class. No.: 621.381548

Lock-in thermography = basics and use for evaluating electronic devices and materials /
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