Language:
English
繁體中文
Help
Login
Back
Switch To:
Labeled
|
MARC Mode
|
ISBD
Advanced mathematical and computatio...
~
Pavese, Franco.
Advanced mathematical and computational tools in metrology and testing X
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Advanced mathematical and computational tools in metrology and testing X/ editors, F. Pavese ... [et al.].
other author:
Pavese, Franco.
Published:
Singapore :World Scientific, : c2015.,
Description:
1 online resource (xi, 429 p.) :ill. (some col.) :
Notes:
Title from PDF title page (viewed June 15, 2015)
Subject:
Metrology. -
Online resource:
http://www.worldscientific.com/worldscibooks/10.1142/9610#t=toc
ISBN:
9789814678629
Advanced mathematical and computational tools in metrology and testing X
Advanced mathematical and computational tools in metrology and testing X
[electronic resource] /editors, F. Pavese ... [et al.]. - 1st ed. - Singapore :World Scientific,c2015. - 1 online resource (xi, 429 p.) :ill. (some col.) - Series on advances in mathematics for applied sciences ;v. 86. - Series on advances in mathematics for applied sciences ;v. 83..
Title from PDF title page (viewed June 15, 2015)
Includes bibliographical references and indexes.
"This volume contains original and refereed contributions from the tenth AMCTM Conference (http://www.nviim.ru/AMCTM2014) held in St. Petersburg (Russia) in September 2014 on the theme of advanced mathematical and computational tools in metrology and testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards."--Provided by publisher.
Electronic reproduction.
Singapore :
World Scientific,
[2015].
Mode of access: World Wide Web.
System requirements: Adobe Acrobat Reader required to view PDF file.
ISBN: 9789814678629
LCCN: 2015008632Subjects--Topical Terms:
786241
Metrology.
LC Class. No.: QC88 / .A38 2015
Dewey Class. No.: 389.1015195
Advanced mathematical and computational tools in metrology and testing X
LDR
:01857cam a2200325Ka 4500
001
948155
003
WSP
005
20150506085705.5
006
m o d
007
cr cn|||||||||
008
200619s2015 si a ob 001 0 eng d
010
$a
2015008632
020
$a
9789814678629
$q
(electronic bk.)
020
$z
9789814678612
035
$a
ocn908447825
040
$a
WSPC
$b
eng
$c
WSPC
050
4
$a
QC88
$b
.A38 2015
082
0 4
$a
389.1015195
$2
23
245
0 0
$a
Advanced mathematical and computational tools in metrology and testing X
$h
[electronic resource] /
$c
editors, F. Pavese ... [et al.].
250
$a
1st ed.
260
$a
Singapore :
$b
World Scientific,
$c
c2015.
300
$a
1 online resource (xi, 429 p.) :
$b
ill. (some col.)
490
1
$a
Series on advances in mathematics for applied sciences ;
$v
v. 86
500
$a
Title from PDF title page (viewed June 15, 2015)
504
$a
Includes bibliographical references and indexes.
520
$a
"This volume contains original and refereed contributions from the tenth AMCTM Conference (http://www.nviim.ru/AMCTM2014) held in St. Petersburg (Russia) in September 2014 on the theme of advanced mathematical and computational tools in metrology and testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards."--Provided by publisher.
533
$a
Electronic reproduction.
$b
Singapore :
$c
World Scientific,
$d
[2015].
$n
Mode of access: World Wide Web.
538
$a
System requirements: Adobe Acrobat Reader required to view PDF file.
538
$a
Mode of access: World Wide Web.
588
$a
Description based on print version record.
650
0
$a
Metrology.
$3
786241
650
0
$a
Statistics.
$3
556824
700
1
$a
Pavese, Franco.
$3
791996
830
0
$a
Series on advances in mathematics for applied sciences ;
$v
v. 83.
$3
856843
856
4 0
$u
http://www.worldscientific.com/worldscibooks/10.1142/9610#t=toc
based on 0 review(s)
Multimedia
Reviews
Add a review
and share your thoughts with other readers
Export
pickup library
Processing
...
Change password
Login