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Quantum metrology, imaging, and communication

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Quantum metrology, imaging, and communication/ by David S. Simon, Gregg Jaeger, Alexander V. Sergienko.
作者:	Simon, David S.
其他作者:	Jaeger, Gregg.
出版者:	Cham :Springer International Publishing : : 2017.,
面頁冊數:	xii, 273 p. :ill., digital ; : 24 cm.;
Contained By:	Springer eBooks
標題:	Quantum theory. -
電子資源:	http://dx.doi.org/10.1007/978-3-319-46551-7
ISBN:	9783319465517

Quantum metrology, imaging, and communication
Simon, David S.

Quantum metrology, imaging, and communication[electronic resource] /by David S. Simon, Gregg Jaeger, Alexander V. Sergienko. - Cham :Springer International Publishing :2017. - xii, 273 p. :ill., digital ;24 cm. - Quantum science and technology,2364-9054. - Quantum science and technology..

Quantum Optics and Entanglement -- Two-Photon Interference- Aberration and Dispersion Cancelation -- Quantum Metrology -- Polarization Mode Dispersion -- Ghost Imaging and Related Topics -- Quantum Microscopy -- Correlated and Entangled Orbital Angular Momentum -- Quantum Communication and Cryptography -- Appendices A: Review of Optics -- B: Optical Fields in Quantum Mechanics -- C: Optical Effects of Aberration and Turbulence -- D: Phase Matching in Spontaneous Parametric Down Conversion -- E: Vectorial Scattering Analysis of the Twin-Photon Microscope.

This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.

ISBN: 9783319465517

Standard No.: 10.1007/978-3-319-46551-7doiSubjects--Topical Terms:

568041
Quantum theory.

LC Class. No.: QC174.12

Dewey Class. No.: 530.12

Quantum metrology, imaging, and communication
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