國立虎尾科技大學 |

Low-power CMOS digital pixel imagers for high-speed uncooled PbSe IR applications

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Low-power CMOS digital pixel imagers for high-speed uncooled PbSe IR applications/ by Josep Maria Margarit.
作者:	Margarit, Josep Maria.
出版者:	Cham :Springer International Publishing : : 2017.,
面頁冊數:	xxi, 173 p. :ill., digital ; : 24 cm.;
Contained By:	Springer eBooks
標題:	Infrared imaging. -
電子資源:	http://dx.doi.org/10.1007/978-3-319-49962-8
ISBN:	9783319499628

Low-power CMOS digital pixel imagers for high-speed uncooled PbSe IR applications
Margarit, Josep Maria.

Low-power CMOS digital pixel imagers for high-speed uncooled PbSe IR applications[electronic resource] /by Josep Maria Margarit. - Cham :Springer International Publishing :2017. - xxi, 173 p. :ill., digital ;24 cm. - Springer theses,2190-5053. - Springer theses..

Introduction -- Frame-Based Smart IR Imagers -- Frame-Free Compact-Pitch IR Imagers -- Pixel Test Chips in 0.35mm and 0.15mm CMOS Technologies -- Imager Test Chips in 2.5mm, 0.35mm and 0.15mm CMOS Technologies -- Conclusions.

This book describes the development of a new low-cost medium wavelength IR (MWIR) monolithic imager technology for high-speed uncooled industrial applications. It takes the baton on the latest technological advances in the field of vapor phase deposition (VPD) PbSe-based MWIR detection accomplished by the industrial partner NIT S.L., adding fundamental knowledge on the investigation of novel VLSI analog and mixed-signal design techniques at circuit and system levels for the development of the readout integrated device attached to the detector. In order to fulfill the operational requirements of VPD PbSe, this work proposes null inter-pixel crosstalk vision sensor architectures based on a digital-only focal plane array (FPA) of configurable pixel sensors. Each digital pixel sensor (DPS) cell is equipped with fast communication modules, self-biasing, offset cancellation, analog-to-digital converter (ADC) and fixed pattern noise (FPN) correction. In-pixel power consumption is minimized by the use of comprehensive MOSFET subthreshold operation.

ISBN: 9783319499628

Standard No.: 10.1007/978-3-319-49962-8doiSubjects--Topical Terms:

877275
Infrared imaging.

LC Class. No.: TA1570

Dewey Class. No.: 621.3672

Low-power CMOS digital pixel imagers for high-speed uncooled PbSe IR applications
LDR:02313nam a2200337 a 4500 001 957883
003 DE-He213
005 20170629093020.0
006 m d
007 cr nn 008maaau
008 201118s2017 gw s 0 eng d
020 $a 9783319499628 $q (electronic bk.)
020 $a 9783319499611 $q (paper)
024 7 $a 10.1007/978-3-319-49962-8 $2 doi
035 $a 978-3-319-49962-8
040 $a GP $c GP
041 0 $a eng
050 4 $a TA1570
072 7 $a TJF $2 bicssc
072 7 $a TEC008000 $2 bisacsh
072 7 $a TEC008070 $2 bisacsh
082 0 4 $a 621.3672 $2 23
090 $a TA1570 $b .M327 2017
100 1 $a Margarit, Josep Maria. $3 1129583
245 1 0 $a Low-power CMOS digital pixel imagers for high-speed uncooled PbSe IR applications $h [electronic resource] / $c by Josep Maria Margarit.
260 $a Cham : $c 2017. $b Springer International Publishing : $b Imprint: Springer,
300 $a xxi, 173 p. : $b ill., digital ; $c 24 cm.
490 1 $a Springer theses, $x 2190-5053
505 0 $a Introduction -- Frame-Based Smart IR Imagers -- Frame-Free Compact-Pitch IR Imagers -- Pixel Test Chips in 0.35mm and 0.15mm CMOS Technologies -- Imager Test Chips in 2.5mm, 0.35mm and 0.15mm CMOS Technologies -- Conclusions.
520 $a This book describes the development of a new low-cost medium wavelength IR (MWIR) monolithic imager technology for high-speed uncooled industrial applications. It takes the baton on the latest technological advances in the field of vapor phase deposition (VPD) PbSe-based MWIR detection accomplished by the industrial partner NIT S.L., adding fundamental knowledge on the investigation of novel VLSI analog and mixed-signal design techniques at circuit and system levels for the development of the readout integrated device attached to the detector. In order to fulfill the operational requirements of VPD PbSe, this work proposes null inter-pixel crosstalk vision sensor architectures based on a digital-only focal plane array (FPA) of configurable pixel sensors. Each digital pixel sensor (DPS) cell is equipped with fast communication modules, self-biasing, offset cancellation, analog-to-digital converter (ADC) and fixed pattern noise (FPN) correction. In-pixel power consumption is minimized by the use of comprehensive MOSFET subthreshold operation.
650 0 $a Infrared imaging. $3 877275
650 0 $a Metal oxide semiconductors, Complementary. $3 596746
650 1 4 $a Engineering. $3 561152
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 670219
650 2 4 $a Solid State Physics. $3 768851
650 2 4 $a Image Processing and Computer Vision. $3 670819
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer eBooks
830 0 $a Springer theses. $3 831604
856 4 0 $u http://dx.doi.org/10.1007/978-3-319-49962-8
950 $a Engineering (Springer-11647)