國立虎尾科技大學 |

Circuit Design for Reliability

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Circuit Design for Reliability/ edited by Ricardo Reis, Yu Cao, Gilson Wirth.
其他作者:	Reis, Ricardo.
面頁冊數:	VI, 272 p. 190 illus., 132 illus. in color.online resource. :
Contained By:	Springer Nature eBook
標題:	Electronic circuits. -
電子資源:	https://doi.org/10.1007/978-1-4614-4078-9
ISBN:	9781461440789

Circuit Design for Reliability
Circuit Design for Reliability[electronic resource] /edited by Ricardo Reis, Yu Cao, Gilson Wirth. - 1st ed. 2015. - VI, 272 p. 190 illus., 132 illus. in color.online resource.

Introduction -- Recent Trends in Bias Temperature Instability -- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability -- Atomistic Simulations on Reliability -- On-chip characterization of statistical device degradation -- Circuit Resilience Roadmap -- Layout Aware Electromigration Analysis of Power/Ground Networks -- Power-Gating for Leakage Control and Beyond -- Soft Error Rate and Fault Tolerance Techniques for FPGAs.

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management. Provides comprehensive review on various reliability mechanisms at sub-45nm nodes; Describes practical modeling and characterization techniques for reliability; Includes thorough presentation of robust design techniques for major VLSI design units; Promotes physical understanding with first-principle simulations.

ISBN: 9781461440789

Standard No.: 10.1007/978-1-4614-4078-9doiSubjects--Topical Terms:

563332
Electronic circuits.

LC Class. No.: TK7888.4

Dewey Class. No.: 621.3815

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