國立虎尾科技大學 |

Circuit Design for Reliability

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Circuit Design for Reliability/ edited by Ricardo Reis, Yu Cao, Gilson Wirth.
other author:	Reis, Ricardo.
Description:	VI, 272 p. 190 illus., 132 illus. in color.online resource. :
Contained By:	Springer Nature eBook
Subject:	Electronic circuits. -
Online resource:	https://doi.org/10.1007/978-1-4614-4078-9
ISBN:	9781461440789

Circuit Design for Reliability
Circuit Design for Reliability[electronic resource] /edited by Ricardo Reis, Yu Cao, Gilson Wirth. - 1st ed. 2015. - VI, 272 p. 190 illus., 132 illus. in color.online resource.

Introduction -- Recent Trends in Bias Temperature Instability -- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability -- Atomistic Simulations on Reliability -- On-chip characterization of statistical device degradation -- Circuit Resilience Roadmap -- Layout Aware Electromigration Analysis of Power/Ground Networks -- Power-Gating for Leakage Control and Beyond -- Soft Error Rate and Fault Tolerance Techniques for FPGAs.

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management. Provides comprehensive review on various reliability mechanisms at sub-45nm nodes; Describes practical modeling and characterization techniques for reliability; Includes thorough presentation of robust design techniques for major VLSI design units; Promotes physical understanding with first-principle simulations.

ISBN: 9781461440789

Standard No.: 10.1007/978-1-4614-4078-9doiSubjects--Topical Terms:

563332
Electronic circuits.

LC Class. No.: TK7888.4

Dewey Class. No.: 621.3815

Circuit Design for Reliability
LDR:02506nam a22003975i 4500 001 960454
003 DE-He213
005 20200706013415.0
007 cr nn 008mamaa
008 201211s2015 xxu| s |||| 0|eng d
020 $a 9781461440789 $9 978-1-4614-4078-9
024 7 $a 10.1007/978-1-4614-4078-9 $2 doi
035 $a 978-1-4614-4078-9
050 4 $a TK7888.4
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 621.3815 $2 23
245 1 0 $a Circuit Design for Reliability $h [electronic resource] / $c edited by Ricardo Reis, Yu Cao, Gilson Wirth.
250 $a 1st ed. 2015.
264 1 $a New York, NY : $b Springer New York : $b Imprint: Springer, $c 2015.
300 $a VI, 272 p. 190 illus., 132 illus. in color. $b online resource.
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
347 $a text file $b PDF $2 rda
505 0 $a Introduction -- Recent Trends in Bias Temperature Instability -- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability -- Atomistic Simulations on Reliability -- On-chip characterization of statistical device degradation -- Circuit Resilience Roadmap -- Layout Aware Electromigration Analysis of Power/Ground Networks -- Power-Gating for Leakage Control and Beyond -- Soft Error Rate and Fault Tolerance Techniques for FPGAs.
520 $a This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management. Provides comprehensive review on various reliability mechanisms at sub-45nm nodes; Describes practical modeling and characterization techniques for reliability; Includes thorough presentation of robust design techniques for major VLSI design units; Promotes physical understanding with first-principle simulations.
650 0 $a Electronic circuits. $3 563332
650 0 $a Quality control. $3 573723
650 0 $a Reliability. $3 573603
650 0 $a Industrial safety. $3 568114
650 0 $a Computer-aided engineering. $3 560192
650 1 4 $a Circuits and Systems. $3 670901
650 2 4 $a Quality Control, Reliability, Safety and Risk. $3 671184
650 2 4 $a Computer-Aided Engineering (CAD, CAE) and Design. $3 669928
700 1 $a Reis, Ricardo. $4 edt $4 http://id.loc.gov/vocabulary/relators/edt $3 677079
700 1 $a Cao, Yu. $4 edt $4 http://id.loc.gov/vocabulary/relators/edt $3 786488
700 1 $a Wirth, Gilson. $4 edt $4 http://id.loc.gov/vocabulary/relators/edt $3 1021187
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer Nature eBook
776 0 8 $i Printed edition: $z 9781461440796
776 0 8 $i Printed edition: $z 9781461440772
776 0 8 $i Printed edition: $z 9781493941568
856 4 0 $u https://doi.org/10.1007/978-1-4614-4078-9
912 $a ZDB-2-ENG
912 $a ZDB-2-SXE
950 $a Engineering (SpringerNature-11647)
950 $a Engineering (R0) (SpringerNature-43712)