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Silicon Analog Components = Device Design, Process Integration, Characterization, and Reliability /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Silicon Analog Components/ by Badih El-Kareh, Lou N. Hutter.
其他題名:	Device Design, Process Integration, Characterization, and Reliability /
作者:	El-Kareh, Badih.
其他作者:	Hutter, Lou N.
面頁冊數:	XLI, 607 p. 454 illus.online resource. :
Contained By:	Springer Nature eBook
標題:	Electronic circuits. -
電子資源:	https://doi.org/10.1007/978-1-4939-2751-7
ISBN:	9781493927517

Silicon Analog Components = Device Design, Process Integration, Characterization, and Reliability /
El-Kareh, Badih.

Silicon Analog ComponentsDevice Design, Process Integration, Characterization, and Reliability /[electronic resource] :by Badih El-Kareh, Lou N. Hutter. - 1st ed. 2015. - XLI, 607 p. 454 illus.online resource.

The World Is Analog -- Review of Single-Crystal Silicon Properties -- PN Junctions -- Rectifying and Ohmic Contacts -- Bipolar and Junction Field-Effect Transistors -- High-Voltage and Power Transistors -- Passive Components -- Process Integration -- Mismatch and Noise -- Chip Reliability.

This book covers modern analog components, their characteristics, and interactions with process parameters. It serves as a comprehensive guide, addressing both the theoretical and practical aspects of modern silicon devices and the relationship between their electrical properties and processing conditions. Based on the authors’ extensive experience in the development of analog devices, this book is intended for engineers and scientists in semiconductor research, development and manufacturing. The problems at the end of each chapter and the numerous charts, figures and tables also make it appropriate for use as a text in graduate and advanced undergraduate courses in electrical engineering and materials science.

ISBN: 9781493927517

Standard No.: 10.1007/978-1-4939-2751-7doiSubjects--Topical Terms:

563332
Electronic circuits.

LC Class. No.: TK7888.4

Dewey Class. No.: 621.3815

Silicon Analog Components = Device Design, Process Integration, Characterization, and Reliability /
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