國立虎尾科技大學 |

Scanning Probe Microscopy = Atomic Force Microscopy and Scanning Tunneling Microscopy /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Scanning Probe Microscopy/ by Bert Voigtländer.
Reminder of title:	Atomic Force Microscopy and Scanning Tunneling Microscopy /
Author:	Voigtländer, Bert.
Description:	XV, 382 p. 189 illus., 148 illus. in color.online resource. :
Contained By:	Springer Nature eBook
Subject:	Nanotechnology. -
Online resource:	https://doi.org/10.1007/978-3-662-45240-0
ISBN:	9783662452400

Scanning Probe Microscopy = Atomic Force Microscopy and Scanning Tunneling Microscopy /
Voigtländer, Bert.

Scanning Probe MicroscopyAtomic Force Microscopy and Scanning Tunneling Microscopy /[electronic resource] :by Bert Voigtländer. - 1st ed. 2015. - XV, 382 p. 189 illus., 148 illus. in color.online resource. - NanoScience and Technology,1434-4904. - NanoScience and Technology,.

Introduction -- Harmonic Oscillator -- Technical Aspects of Scanning Probe Microscopy -- Scanning Probe Microscopy Designs -- Electronics for Scanning Probe Microscopy -- Lock-In Technique -- Data Representation and Image Processing -- Artifacts in SPM -- Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy -- Surface States -- Forces Between Tip and Sample -- Technical Aspects of Atomic force Microscopy (AFM) -- Static Atomic Force Microscopy -- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy -- Intermittent Contact Mode/Tapping Mode -- Mapping of Mechanical Properties Using Force-Distance Curves -- Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy -- Noise in Atomic Force Microscopy -- Quartz Sensors in Atomic force Microscopy -- Scanning Tunneling Microscopy -- Scanning Tunneling Spectroscopy (STS) -- Vibrational Spectroscopy with the STM -- Spectroscopy and Imaging of Surface States -- Building Nanostructures Atom by Atom.

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

ISBN: 9783662452400

Standard No.: 10.1007/978-3-662-45240-0doiSubjects--Topical Terms:

557660
Nanotechnology.

LC Class. No.: T174.7

Dewey Class. No.: 620.115

Scanning Probe Microscopy = Atomic Force Microscopy and Scanning Tunneling Microscopy /
LDR:03045nam a22004215i 4500 001 967999
003 DE-He213
005 20200702024730.0
007 cr nn 008mamaa
008 201211s2015 gw | s |||| 0|eng d
020 $a 9783662452400 $9 978-3-662-45240-0
024 7 $a 10.1007/978-3-662-45240-0 $2 doi
035 $a 978-3-662-45240-0
050 4 $a T174.7
050 4 $a TA418.9.N35
072 7 $a TBN $2 bicssc
072 7 $a TEC027000 $2 bisacsh
072 7 $a TBN $2 thema
082 0 4 $a 620.115 $2 23
100 1 $a Voigtländer, Bert. $e author. $4 aut $4 http://id.loc.gov/vocabulary/relators/aut $3 1263658
245 1 0 $a Scanning Probe Microscopy $h [electronic resource] : $b Atomic Force Microscopy and Scanning Tunneling Microscopy / $c by Bert Voigtländer.
250 $a 1st ed. 2015.
264 1 $a Berlin, Heidelberg : $b Springer Berlin Heidelberg : $b Imprint: Springer, $c 2015.
300 $a XV, 382 p. 189 illus., 148 illus. in color. $b online resource.
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
347 $a text file $b PDF $2 rda
490 1 $a NanoScience and Technology, $x 1434-4904
505 0 $a Introduction -- Harmonic Oscillator -- Technical Aspects of Scanning Probe Microscopy -- Scanning Probe Microscopy Designs -- Electronics for Scanning Probe Microscopy -- Lock-In Technique -- Data Representation and Image Processing -- Artifacts in SPM -- Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy -- Surface States -- Forces Between Tip and Sample -- Technical Aspects of Atomic force Microscopy (AFM) -- Static Atomic Force Microscopy -- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy -- Intermittent Contact Mode/Tapping Mode -- Mapping of Mechanical Properties Using Force-Distance Curves -- Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy -- Noise in Atomic Force Microscopy -- Quartz Sensors in Atomic force Microscopy -- Scanning Tunneling Microscopy -- Scanning Tunneling Spectroscopy (STS) -- Vibrational Spectroscopy with the STM -- Spectroscopy and Imaging of Surface States -- Building Nanostructures Atom by Atom.
520 $a This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
650 0 $a Nanotechnology. $3 557660
650 0 $a Condensed matter. $3 579760
650 2 4 $a Nanotechnology and Microengineering. $3 722030
650 2 4 $a Condensed Matter Physics. $3 768417
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer Nature eBook
776 0 8 $i Printed edition: $z 9783662452417
776 0 8 $i Printed edition: $z 9783662452394
776 0 8 $i Printed edition: $z 9783662505571
830 0 $a NanoScience and Technology, $x 1434-4904 $3 1254041
856 4 0 $u https://doi.org/10.1007/978-3-662-45240-0
912 $a ZDB-2-CMS
912 $a ZDB-2-SXC
950 $a Chemistry and Materials Science (SpringerNature-11644)
950 $a Chemistry and Material Science (R0) (SpringerNature-43709)