國立虎尾科技大學 |

Development of Infrared Techniques for Practical Defect Identification in Bonded Joints

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Development of Infrared Techniques for Practical Defect Identification in Bonded Joints/ by Rachael C. Waugh.
作者:	Waugh, Rachael C.
面頁冊數:	XXVIII, 149 p.online resource. :
Contained By:	Springer Nature eBook
標題:	Materials science. -
電子資源:	https://doi.org/10.1007/978-3-319-22982-9
ISBN:	9783319229829

Development of Infrared Techniques for Practical Defect Identification in Bonded Joints
Waugh, Rachael C.

Development of Infrared Techniques for Practical Defect Identification in Bonded Joints[electronic resource] /by Rachael C. Waugh. - 1st ed. 2016. - XXVIII, 149 p.online resource. - Springer Theses, Recognizing Outstanding Ph.D. Research,2190-5053. - Springer Theses, Recognizing Outstanding Ph.D. Research,.

Introduction -- Adhesive bonding -- Non-destructive evaluation -- The physics and implementation of thermography -- Preliminary results -- Numerical modelling -- Kissing defects -- Practical application of PT/PPT.- Industrial applications -- Conclusions and future work.

Maximizing reader insights into the use of thermography, specifically pulsed and pulse phase thermography (PT and PPT), for the identification of kissing defects in adhesive bonds, this thesis focuses on the application of PT and PPT for the identification of a range of defect types in a variety of materials to establish the effect of material properties on identification of defects. Featuring analysis of a numerical model developed to simulate the thermal evolution created during a PT or PPT experiment, after validation through a series of case studies, this model is then used as a predictive tool to relate defect detectability to the thermal property contrast between defect and bulk materials. Demonstrating a means of producing realistic kissing defects in bonded joints where insufficient thermal property contrast exists defects have a limited effect on heat propagation through a component and therefore are not detected using PT or PPT, this thesis discusses the addition of a small load to bonds containing kissing defects which was found to open the defects sufficiently to enable their detection. A low cost infrared detector, Flir Tau320, is compared to the research based photon detector, Flir SC5000, and is shown to be suitable for application in PT, thus enabling a significantly lower cost tool to be developed.

ISBN: 9783319229829

Standard No.: 10.1007/978-3-319-22982-9doiSubjects--Topical Terms:

557839
Materials science.

LC Class. No.: TA404.6

Dewey Class. No.: 620.11

Development of Infrared Techniques for Practical Defect Identification in Bonded Joints
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