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Transmission Electron Microscopy = Diffraction, Imaging, and Spectrometry /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Transmission Electron Microscopy/ edited by C. Barry Carter, David B. Williams.
其他題名:	Diffraction, Imaging, and Spectrometry /
其他作者:	Carter, C. Barry.
面頁冊數:	XXXIII, 518 p. 300 illus.online resource. :
Contained By:	Springer Nature eBook
標題:	Materials science. -
電子資源:	https://doi.org/10.1007/978-3-319-26651-0
ISBN:	9783319266510

Transmission Electron Microscopy = Diffraction, Imaging, and Spectrometry /
Transmission Electron MicroscopyDiffraction, Imaging, and Spectrometry /[electronic resource] :edited by C. Barry Carter, David B. Williams. - 1st ed. 2016. - XXXIII, 518 p. 300 illus.online resource.

Foreword by Sir John Meurig Thomas -- 1. Electron Sources -- 2. In Situ and Operando -- 3. Electron Diffraction and Phase Identification -- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns -- 5. Electron crystallography, charge-density mapping and nanodiffraction -- 6. Digital Micrograph -- 7. Electron waves, interference & coherence -- 8. Electron Holography -- 9. Focal-Series Reconstruction -- 10. Direct Methods For Image Interpretation -- 11. Imaging in the STEM -- 12. Electron Tomography -- 13. Energy-Filtered Transmission Electron Microscopy -- 14. Calculation of Electron Energy-Loss Spectra -- 15. Electron Diffraction & X-Ray Excitation -- 16. X-Ray and Electron Energy-Loss Spectral Imaging -- 17. Practical Aspects and Advanced Applications of XEDS.

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science. Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques. Praise for Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter: “The best textbook for this audience available.” — American Scientist “...highly readable, and an extremely valuable text for all users of the TEM at every level. Treat yourself to a copy!” — Microscopy and Microanalysis “This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.” — Micron “The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.” — MRS Bulletin “It is truly a book so thoughtfully written that … it will provide a solid foundation for those studying material science….an outstanding book.” — IEEE Electrical Insulation Magazine, Vol. 26 (4), July/August, 2010.

ISBN: 9783319266510

Standard No.: 10.1007/978-3-319-26651-0doiSubjects--Topical Terms:

557839
Materials science.

LC Class. No.: TA404.6

Dewey Class. No.: 620.11

Transmission Electron Microscopy = Diffraction, Imaging, and Spectrometry /
LDR:04865nam a22003975i 4500 001 976588
003 DE-He213
005 20200629221110.0
007 cr nn 008mamaa
008 201211s2016 gw | s |||| 0|eng d
020 $a 9783319266510 $9 978-3-319-26651-0
024 7 $a 10.1007/978-3-319-26651-0 $2 doi
035 $a 978-3-319-26651-0
050 4 $a TA404.6
072 7 $a TGMT $2 bicssc
072 7 $a TEC021000 $2 bisacsh
072 7 $a TGMT $2 thema
082 0 4 $a 620.11 $2 23
245 1 0 $a Transmission Electron Microscopy $h [electronic resource] : $b Diffraction, Imaging, and Spectrometry / $c edited by C. Barry Carter, David B. Williams.
250 $a 1st ed. 2016.
264 1 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2016.
300 $a XXXIII, 518 p. 300 illus. $b online resource.
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
347 $a text file $b PDF $2 rda
505 0 $a Foreword by Sir John Meurig Thomas -- 1. Electron Sources -- 2. In Situ and Operando -- 3. Electron Diffraction and Phase Identification -- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns -- 5. Electron crystallography, charge-density mapping and nanodiffraction -- 6. Digital Micrograph -- 7. Electron waves, interference & coherence -- 8. Electron Holography -- 9. Focal-Series Reconstruction -- 10. Direct Methods For Image Interpretation -- 11. Imaging in the STEM -- 12. Electron Tomography -- 13. Energy-Filtered Transmission Electron Microscopy -- 14. Calculation of Electron Energy-Loss Spectra -- 15. Electron Diffraction & X-Ray Excitation -- 16. X-Ray and Electron Energy-Loss Spectral Imaging -- 17. Practical Aspects and Advanced Applications of XEDS.
520 $a This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science. Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques. Praise for Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter: “The best textbook for this audience available.” — American Scientist “...highly readable, and an extremely valuable text for all users of the TEM at every level. Treat yourself to a copy!” — Microscopy and Microanalysis “This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.” — Micron “The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.” — MRS Bulletin “It is truly a book so thoughtfully written that … it will provide a solid foundation for those studying material science….an outstanding book.” — IEEE Electrical Insulation Magazine, Vol. 26 (4), July/August, 2010.
650 0 $a Materials science. $3 557839
650 0 $a Nanoscale science. $3 1253587
650 0 $a Nanoscience. $3 632473
650 0 $a Nanostructures. $3 561754
650 0 $a Spectroscopy. $3 1102161
650 0 $a Solid state physics. $3 641431
650 0 $a Microscopy. $3 582141
650 0 $a Mechanics. $3 527684
650 0 $a Mechanics, Applied. $3 596630
650 1 4 $a Characterization and Evaluation of Materials. $3 674449
650 2 4 $a Nanoscale Science and Technology. $3 783795
650 2 4 $a Spectroscopy/Spectrometry. $3 782573
650 2 4 $a Solid State Physics. $3 768851
650 2 4 $a Spectroscopy and Microscopy. $3 768852
650 2 4 $a Solid Mechanics. $3 1211586
700 1 $a Carter, C. Barry. $4 edt $4 http://id.loc.gov/vocabulary/relators/edt $3 793719
700 1 $a Williams, David B. $4 edt $4 http://id.loc.gov/vocabulary/relators/edt $3 793718
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer Nature eBook
776 0 8 $i Printed edition: $z 9783319266497
776 0 8 $i Printed edition: $z 9783319266503
776 0 8 $i Printed edition: $z 9783319799889
856 4 0 $u https://doi.org/10.1007/978-3-319-26651-0
912 $a ZDB-2-CMS
912 $a ZDB-2-SXC
950 $a Chemistry and Materials Science (SpringerNature-11644)
950 $a Chemistry and Material Science (R0) (SpringerNature-43709)