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VLSI-SoC: Design for Reliability, Security, and Low Power = 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	VLSI-SoC: Design for Reliability, Security, and Low Power/ edited by Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis.
其他題名:	23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers /
其他作者:	Shin, Youngsoo.
面頁冊數:	XIII, 223 p. 121 illus.online resource. :
Contained By:	Springer Nature eBook
標題:	Computer organization. -
電子資源:	https://doi.org/10.1007/978-3-319-46097-0
ISBN:	9783319460970

VLSI-SoC: Design for Reliability, Security, and Low Power = 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers /
VLSI-SoC: Design for Reliability, Security, and Low Power23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers /[electronic resource] :edited by Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis. - 1st ed. 2016. - XIII, 223 p. 121 illus.online resource. - IFIP Advances in Information and Communication Technology,4831868-4238 ;. - IFIP Advances in Information and Communication Technology,449.

This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.

ISBN: 9783319460970

Standard No.: 10.1007/978-3-319-46097-0doiSubjects--Topical Terms:

596298
Computer organization.

LC Class. No.: QA76.9.C643

Dewey Class. No.: 004.6

VLSI-SoC: Design for Reliability, Security, and Low Power = 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers /
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