VLSI-SoC: Design for Reliability, Se...
Tsui, Chi Ying.

 

  • VLSI-SoC: Design for Reliability, Security, and Low Power = 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers /
  • 紀錄類型: 書目-語言資料,印刷品 : Monograph/item
    正題名/作者: VLSI-SoC: Design for Reliability, Security, and Low Power/ edited by Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis.
    其他題名: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers /
    其他作者: Shin, Youngsoo.
    面頁冊數: XIII, 223 p. 121 illus.online resource. :
    Contained By: Springer Nature eBook
    標題: Computer organization. -
    電子資源: https://doi.org/10.1007/978-3-319-46097-0
    ISBN: 9783319460970
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