Language:
English
繁體中文
Help
Login
Back
Switch To:
Labeled
|
MARC Mode
|
ISBD
Structural, Syntactic, and Statistic...
~
Loog, Marco.
Structural, Syntactic, and Statistical Pattern Recognition = Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Structural, Syntactic, and Statistical Pattern Recognition/ edited by Antonio Robles-Kelly, Marco Loog, Battista Biggio, Francisco Escolano, Richard Wilson.
Reminder of title:
Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings /
other author:
Robles-Kelly, Antonio.
Description:
XIII, 588 p. 167 illus.online resource. :
Contained By:
Springer Nature eBook
Subject:
Artificial intelligence. -
Online resource:
https://doi.org/10.1007/978-3-319-49055-7
ISBN:
9783319490557
Structural, Syntactic, and Statistical Pattern Recognition = Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings /
Structural, Syntactic, and Statistical Pattern Recognition
Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings /[electronic resource] :edited by Antonio Robles-Kelly, Marco Loog, Battista Biggio, Francisco Escolano, Richard Wilson. - 1st ed. 2016. - XIII, 588 p. 167 illus.online resource. - Image Processing, Computer Vision, Pattern Recognition, and Graphics ;10029. - Image Processing, Computer Vision, Pattern Recognition, and Graphics ;9219.
Dimensionality reduction -- Manifold learning and embedding methods.-Dissimilarity representations -- Graph-theoretic methods -- Model selection, classification and clustering -- Semi and fully supervised learning methods -- Shape analysis -- Spatio-temporal pattern recognition -- Structural matching -- Text and document analysis. .
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis. .
ISBN: 9783319490557
Standard No.: 10.1007/978-3-319-49055-7doiSubjects--Topical Terms:
559380
Artificial intelligence.
LC Class. No.: Q334-342
Dewey Class. No.: 006.3
Structural, Syntactic, and Statistical Pattern Recognition = Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings /
LDR
:02716nam a22004095i 4500
001
980940
003
DE-He213
005
20200705072736.0
007
cr nn 008mamaa
008
201211s2016 gw | s |||| 0|eng d
020
$a
9783319490557
$9
978-3-319-49055-7
024
7
$a
10.1007/978-3-319-49055-7
$2
doi
035
$a
978-3-319-49055-7
050
4
$a
Q334-342
072
7
$a
UYQ
$2
bicssc
072
7
$a
COM004000
$2
bisacsh
072
7
$a
UYQ
$2
thema
082
0 4
$a
006.3
$2
23
245
1 0
$a
Structural, Syntactic, and Statistical Pattern Recognition
$h
[electronic resource] :
$b
Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings /
$c
edited by Antonio Robles-Kelly, Marco Loog, Battista Biggio, Francisco Escolano, Richard Wilson.
250
$a
1st ed. 2016.
264
1
$a
Cham :
$b
Springer International Publishing :
$b
Imprint: Springer,
$c
2016.
300
$a
XIII, 588 p. 167 illus.
$b
online resource.
336
$a
text
$b
txt
$2
rdacontent
337
$a
computer
$b
c
$2
rdamedia
338
$a
online resource
$b
cr
$2
rdacarrier
347
$a
text file
$b
PDF
$2
rda
490
1
$a
Image Processing, Computer Vision, Pattern Recognition, and Graphics ;
$v
10029
505
0
$a
Dimensionality reduction -- Manifold learning and embedding methods.-Dissimilarity representations -- Graph-theoretic methods -- Model selection, classification and clustering -- Semi and fully supervised learning methods -- Shape analysis -- Spatio-temporal pattern recognition -- Structural matching -- Text and document analysis. .
520
$a
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis. .
650
0
$a
Artificial intelligence.
$3
559380
650
0
$a
Pattern recognition.
$3
1253525
650
0
$a
Application software.
$3
528147
650
0
$a
Database management.
$3
557799
650
0
$a
Algorithms.
$3
527865
650
0
$a
Data mining.
$3
528622
650
1 4
$a
Artificial Intelligence.
$3
646849
650
2 4
$a
Pattern Recognition.
$3
669796
650
2 4
$a
Information Systems Applications (incl. Internet).
$3
881699
650
2 4
$a
Database Management.
$3
669820
650
2 4
$a
Algorithm Analysis and Problem Complexity.
$3
593923
650
2 4
$a
Data Mining and Knowledge Discovery.
$3
677765
700
1
$a
Robles-Kelly, Antonio.
$4
edt
$4
http://id.loc.gov/vocabulary/relators/edt
$3
1072261
700
1
$a
Loog, Marco.
$4
edt
$4
http://id.loc.gov/vocabulary/relators/edt
$3
815662
700
1
$a
Biggio, Battista.
$e
editor.
$4
edt
$4
http://id.loc.gov/vocabulary/relators/edt
$3
1273531
700
1
$a
Escolano, Francisco.
$e
editor.
$4
edt
$4
http://id.loc.gov/vocabulary/relators/edt
$3
1273532
700
1
$a
Wilson, Richard.
$4
edt
$4
http://id.loc.gov/vocabulary/relators/edt
$3
1078118
710
2
$a
SpringerLink (Online service)
$3
593884
773
0
$t
Springer Nature eBook
776
0 8
$i
Printed edition:
$z
9783319490540
776
0 8
$i
Printed edition:
$z
9783319490564
830
0
$a
Image Processing, Computer Vision, Pattern Recognition, and Graphics ;
$v
9219
$3
1253644
856
4 0
$u
https://doi.org/10.1007/978-3-319-49055-7
912
$a
ZDB-2-SCS
912
$a
ZDB-2-SXCS
912
$a
ZDB-2-LNC
950
$a
Computer Science (SpringerNature-11645)
950
$a
Computer Science (R0) (SpringerNature-43710)
based on 0 review(s)
Multimedia
Reviews
Add a review
and share your thoughts with other readers
Export
pickup library
Processing
...
Change password
Login