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Lock-in Thermography = Basics and Us...
~
Breitenstein, Otwin.
Lock-in Thermography = Basics and Use for Evaluating Electronic Devices and Materials /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Lock-in Thermography/ by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert.
Reminder of title:
Basics and Use for Evaluating Electronic Devices and Materials /
Author:
Breitenstein, Otwin.
other author:
Warta, Wilhelm.
Description:
XXI, 321 p. 126 illus., 68 illus. in color.online resource. :
Contained By:
Springer Nature eBook
Subject:
Lasers. -
Online resource:
https://doi.org/10.1007/978-3-319-99825-1
ISBN:
9783319998251
Lock-in Thermography = Basics and Use for Evaluating Electronic Devices and Materials /
Breitenstein, Otwin.
Lock-in Thermography
Basics and Use for Evaluating Electronic Devices and Materials /[electronic resource] :by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert. - 3rd ed. 2018. - XXI, 321 p. 126 illus., 68 illus. in color.online resource. - Springer Series in Advanced Microelectronics,101437-0387 ;. - Springer Series in Advanced Microelectronics,49.
Introduction -- Physical and Technical Basics -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook. .
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.
ISBN: 9783319998251
Standard No.: 10.1007/978-3-319-99825-1doiSubjects--Topical Terms:
557748
Lasers.
LC Class. No.: TA1671-1707
Dewey Class. No.: 621.36
Lock-in Thermography = Basics and Use for Evaluating Electronic Devices and Materials /
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