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Lock-in Thermography = Basics and Use for Evaluating Electronic Devices and Materials /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Lock-in Thermography/ by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert.
其他題名:	Basics and Use for Evaluating Electronic Devices and Materials /
作者:	Breitenstein, Otwin.
其他作者:	Warta, Wilhelm.
面頁冊數:	XXI, 321 p. 126 illus., 68 illus. in color.online resource. :
Contained By:	Springer Nature eBook
標題:	Lasers. -
電子資源:	https://doi.org/10.1007/978-3-319-99825-1
ISBN:	9783319998251

Lock-in Thermography = Basics and Use for Evaluating Electronic Devices and Materials /
Breitenstein, Otwin.

Lock-in ThermographyBasics and Use for Evaluating Electronic Devices and Materials /[electronic resource] :by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert. - 3rd ed. 2018. - XXI, 321 p. 126 illus., 68 illus. in color.online resource. - Springer Series in Advanced Microelectronics,101437-0387 ;. - Springer Series in Advanced Microelectronics,49.

Introduction -- Physical and Technical Basics -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook. .

This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.

ISBN: 9783319998251

Standard No.: 10.1007/978-3-319-99825-1doiSubjects--Topical Terms:

557748
Lasers.

LC Class. No.: TA1671-1707

Dewey Class. No.: 621.36

Lock-in Thermography = Basics and Use for Evaluating Electronic Devices and Materials /
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