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Spectroscopic Ellipsometry for Photo...
~
Fujiwara, Hiroyuki.
Spectroscopic Ellipsometry for Photovoltaics = Volume 1: Fundamental Principles and Solar Cell Characterization /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Spectroscopic Ellipsometry for Photovoltaics/ edited by Hiroyuki Fujiwara, Robert W. Collins.
其他題名:
Volume 1: Fundamental Principles and Solar Cell Characterization /
其他作者:
Fujiwara, Hiroyuki.
面頁冊數:
XX, 594 p. 336 illus., 266 illus. in color.online resource. :
Contained By:
Springer Nature eBook
標題:
Lasers. -
電子資源:
https://doi.org/10.1007/978-3-319-75377-5
ISBN:
9783319753775
Spectroscopic Ellipsometry for Photovoltaics = Volume 1: Fundamental Principles and Solar Cell Characterization /
Spectroscopic Ellipsometry for Photovoltaics
Volume 1: Fundamental Principles and Solar Cell Characterization /[electronic resource] :edited by Hiroyuki Fujiwara, Robert W. Collins. - 1st ed. 2018. - XX, 594 p. 336 illus., 266 illus. in color.online resource. - Springer Series in Optical Sciences,2120342-4111 ;. - Springer Series in Optical Sciences,93.
Introduction -- Part I: Fundamental Principles of Ellipsometry -- Measurement Technique of Ellipsometry -- Data Analysis -- Optical Properties of Semiconductors -- Dielectric Function Modeling -- Effect of Roughness on Ellipsometry Analysis -- Part II: Characterization of Materials and Structures -- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon -- Crystalline Silicon Solar Cells -- Amorphous/Crystalline Si Heterojunction Solar Cells -- Optical Properties of Cu(In,Ga)Se2 -- Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization -- Cu2ZnSn(S,Se)4 and Related Materials -- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics -- High Efficiency III-V Solar Cells -- Organic Solar Cells -- Organic-Inorganic Hybrid Perovskite Solar Cells -- Solar Cells with Photonic and Plasmonic Structures -- Transparent Conductive Oxide Materials -- High-Mobility Transparent Conductive Oxide Layers.
This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
ISBN: 9783319753775
Standard No.: 10.1007/978-3-319-75377-5doiSubjects--Topical Terms:
557748
Lasers.
LC Class. No.: TA1671-1707
Dewey Class. No.: 621.36
Spectroscopic Ellipsometry for Photovoltaics = Volume 1: Fundamental Principles and Solar Cell Characterization /
LDR
:03434nam a22004215i 4500
001
991000
003
DE-He213
005
20200705070756.0
007
cr nn 008mamaa
008
201225s2018 gw | s |||| 0|eng d
020
$a
9783319753775
$9
978-3-319-75377-5
024
7
$a
10.1007/978-3-319-75377-5
$2
doi
035
$a
978-3-319-75377-5
050
4
$a
TA1671-1707
050
4
$a
TA1501-1820
072
7
$a
PHJ
$2
bicssc
072
7
$a
SCI053000
$2
bisacsh
072
7
$a
PHJ
$2
thema
072
7
$a
TTB
$2
thema
082
0 4
$a
621.36
$2
23
245
1 0
$a
Spectroscopic Ellipsometry for Photovoltaics
$h
[electronic resource] :
$b
Volume 1: Fundamental Principles and Solar Cell Characterization /
$c
edited by Hiroyuki Fujiwara, Robert W. Collins.
250
$a
1st ed. 2018.
264
1
$a
Cham :
$b
Springer International Publishing :
$b
Imprint: Springer,
$c
2018.
300
$a
XX, 594 p. 336 illus., 266 illus. in color.
$b
online resource.
336
$a
text
$b
txt
$2
rdacontent
337
$a
computer
$b
c
$2
rdamedia
338
$a
online resource
$b
cr
$2
rdacarrier
347
$a
text file
$b
PDF
$2
rda
490
1
$a
Springer Series in Optical Sciences,
$x
0342-4111 ;
$v
212
505
0
$a
Introduction -- Part I: Fundamental Principles of Ellipsometry -- Measurement Technique of Ellipsometry -- Data Analysis -- Optical Properties of Semiconductors -- Dielectric Function Modeling -- Effect of Roughness on Ellipsometry Analysis -- Part II: Characterization of Materials and Structures -- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon -- Crystalline Silicon Solar Cells -- Amorphous/Crystalline Si Heterojunction Solar Cells -- Optical Properties of Cu(In,Ga)Se2 -- Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization -- Cu2ZnSn(S,Se)4 and Related Materials -- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics -- High Efficiency III-V Solar Cells -- Organic Solar Cells -- Organic-Inorganic Hybrid Perovskite Solar Cells -- Solar Cells with Photonic and Plasmonic Structures -- Transparent Conductive Oxide Materials -- High-Mobility Transparent Conductive Oxide Layers.
520
$a
This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
650
0
$a
Lasers.
$3
557748
650
0
$a
Photonics.
$3
562392
650
0
$a
Optical materials.
$3
672695
650
0
$a
Electronic materials.
$3
1253592
650
0
$a
Microwaves.
$3
636639
650
0
$a
Optical engineering.
$3
720802
650
0
$a
Renewable energy resources.
$3
563364
650
1 4
$a
Optics, Lasers, Photonics, Optical Devices.
$3
1112289
650
2 4
$a
Optical and Electronic Materials.
$3
593919
650
2 4
$a
Microwaves, RF and Optical Engineering.
$3
593918
650
2 4
$a
Renewable and Green Energy.
$3
683875
700
1
$a
Fujiwara, Hiroyuki.
$4
edt
$4
http://id.loc.gov/vocabulary/relators/edt
$3
1211902
700
1
$a
Collins, Robert W.
$4
edt
$4
http://id.loc.gov/vocabulary/relators/edt
$3
1211903
710
2
$a
SpringerLink (Online service)
$3
593884
773
0
$t
Springer Nature eBook
776
0 8
$i
Printed edition:
$z
9783319753751
776
0 8
$i
Printed edition:
$z
9783319753768
830
0
$a
Springer Series in Optical Sciences,
$x
0342-4111 ;
$v
93
$3
1253770
856
4 0
$u
https://doi.org/10.1007/978-3-319-75377-5
912
$a
ZDB-2-PHA
912
$a
ZDB-2-SXP
950
$a
Physics and Astronomy (SpringerNature-11651)
950
$a
Physics and Astronomy (R0) (SpringerNature-43715)
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