國立虎尾科技大學 |

Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements/ by Yuming Zhuang, Degang Chen.
Author:	Zhuang, Yuming.
other author:	Chen, Degang.
Description:	XIV, 170 p. 89 illus., 88 illus. in color.online resource. :
Contained By:	Springer Nature eBook
Subject:	Electronic circuits. -
Online resource:	https://doi.org/10.1007/978-3-319-77718-4
ISBN:	9783319777184

Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements
Zhuang, Yuming.

Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements[electronic resource] /by Yuming Zhuang, Degang Chen. - 1st ed. 2018. - XIV, 170 p. 89 illus., 88 illus. in color.online resource.

Chapter 1. Introduction -- Chapter 2.Algorithms for accurate spectral analysis in the presence of arbitrary non-coherency and large distortion -- Chapter 3.Accurate spectral testing with arbitrary non- coherency in sampling and simultaneous drifts in amplitude and frequency -- Chapter 4.High-purity sine wave generation using nonlinear DAC with pre-distortion based on low-cost accurate DAC-ADC co-testing -- Chapter 5.Low cost ultra-pure sine wave generation with self-calibration -- Chapter 6.Accurate spectral testing with non-coherent sampling for multi-tone test -- Chapter 7.Accurate spectral testing with impure test stimulus for multi-tone test -- Chapter 8.Multi-tone sine wave generation achieving the theoretical minimum of peak-to-average power ratio -- Chapter 9.Accurate linearity testing using low purity stimulus robust against flicker noise -- Chapter 10.Summary.

This book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to improve. Test engineers will be enabled to accurately set their devices & systems at much simpler test setup, much reduced complexity and much lower cost.

ISBN: 9783319777184

Standard No.: 10.1007/978-3-319-77718-4doiSubjects--Topical Terms:

563332
Electronic circuits.

LC Class. No.: TK7888.4

Dewey Class. No.: 621.3815

Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements
LDR:02683nam a22003975i 4500 001 991432
003 DE-He213
005 20200702122649.0
007 cr nn 008mamaa
008 201225s2018 gw | s |||| 0|eng d
020 $a 9783319777184 $9 978-3-319-77718-4
024 7 $a 10.1007/978-3-319-77718-4 $2 doi
035 $a 978-3-319-77718-4
050 4 $a TK7888.4
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 621.3815 $2 23
100 1 $a Zhuang, Yuming. $4 aut $4 http://id.loc.gov/vocabulary/relators/aut $3 1202319
245 1 0 $a Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements $h [electronic resource] / $c by Yuming Zhuang, Degang Chen.
250 $a 1st ed. 2018.
264 1 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2018.
300 $a XIV, 170 p. 89 illus., 88 illus. in color. $b online resource.
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
347 $a text file $b PDF $2 rda
505 0 $a Chapter 1. Introduction -- Chapter 2.Algorithms for accurate spectral analysis in the presence of arbitrary non-coherency and large distortion -- Chapter 3.Accurate spectral testing with arbitrary non- coherency in sampling and simultaneous drifts in amplitude and frequency -- Chapter 4.High-purity sine wave generation using nonlinear DAC with pre-distortion based on low-cost accurate DAC-ADC co-testing -- Chapter 5.Low cost ultra-pure sine wave generation with self-calibration -- Chapter 6.Accurate spectral testing with non-coherent sampling for multi-tone test -- Chapter 7.Accurate spectral testing with impure test stimulus for multi-tone test -- Chapter 8.Multi-tone sine wave generation achieving the theoretical minimum of peak-to-average power ratio -- Chapter 9.Accurate linearity testing using low purity stimulus robust against flicker noise -- Chapter 10.Summary.
520 $a This book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to improve. Test engineers will be enabled to accurately set their devices & systems at much simpler test setup, much reduced complexity and much lower cost.
650 0 $a Electronic circuits. $3 563332
650 0 $a Electronics. $3 596389
650 0 $a Microelectronics. $3 554956
650 1 4 $a Circuits and Systems. $3 670901
650 2 4 $a Electronic Circuits and Devices. $3 782968
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 670219
700 1 $a Chen, Degang. $4 aut $4 http://id.loc.gov/vocabulary/relators/aut $3 1202320
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer Nature eBook
776 0 8 $i Printed edition: $z 9783319777177
776 0 8 $i Printed edition: $z 9783319777191
776 0 8 $i Printed edition: $z 9783030085209
856 4 0 $u https://doi.org/10.1007/978-3-319-77718-4
912 $a ZDB-2-ENG
912 $a ZDB-2-SXE
950 $a Engineering (SpringerNature-11647)
950 $a Engineering (R0) (SpringerNature-43712)