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Industrial X-Ray Computed Tomography
~
Dewulf, Wim.
Industrial X-Ray Computed Tomography
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Industrial X-Ray Computed Tomography/ edited by Simone Carmignato, Wim Dewulf, Richard Leach.
其他作者:
Carmignato, Simone.
面頁冊數:
VII, 369 p. 273 illus.online resource. :
Contained By:
Springer Nature eBook
標題:
Materials science. -
電子資源:
https://doi.org/10.1007/978-3-319-59573-3
ISBN:
9783319595733
Industrial X-Ray Computed Tomography
Industrial X-Ray Computed Tomography
[electronic resource] /edited by Simone Carmignato, Wim Dewulf, Richard Leach. - 1st ed. 2018. - VII, 369 p. 273 illus.online resource.
Introduction -- Principles of X-ray computed tomography -- Technical concepts and components -- Processing and visualization of CT data -- Computer simulation -- Error sources -- Performance verification -- Traceability of CT dimensional measurements -- CT for non-destructive testing and materials characterization -- CT for dimensional metrology -- Other industrial applications.
This book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and software in both industry and academia, being also suitable for postgraduate students.
ISBN: 9783319595733
Standard No.: 10.1007/978-3-319-59573-3doiSubjects--Topical Terms:
557839
Materials science.
LC Class. No.: TA404.6
Dewey Class. No.: 620.11
Industrial X-Ray Computed Tomography
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Introduction -- Principles of X-ray computed tomography -- Technical concepts and components -- Processing and visualization of CT data -- Computer simulation -- Error sources -- Performance verification -- Traceability of CT dimensional measurements -- CT for non-destructive testing and materials characterization -- CT for dimensional metrology -- Other industrial applications.
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